The Journal of Reliability Engineering Association of Japan

Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697

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Volume 22, Issue 3

Displaying 1-19 of 19 articles from this issue

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[title in Japanese]

Article type: Cover
2000 Volume 22 Issue 3 Pages Cover1-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_Cover1

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[title in Japanese]

Article type: Appendix
2000 Volume 22 Issue 3 Pages i-iii
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_i

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[title in Japanese]

Article type: Index
2000 Volume 22 Issue 3 Pages iv-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_iv

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[title in Japanese]

Article type: Index
2000 Volume 22 Issue 3 Pages v-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_v

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Evaluation Time Reduction of Reliability Tests

Hiroshi Ozaki

Article type: Article
2000 Volume 22 Issue 3 Pages 177-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_177

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Reliability sampling plan based on Weibull Distribution

Hiroshi Ozaki

Article type: Article
2000 Volume 22 Issue 3 Pages 178-187
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_178

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Concept of a reasonable and effective acceleration reliability test in semiconductor products

Junichi Mitsuhashi

Article type: Article
2000 Volume 22 Issue 3 Pages 188-196
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_188

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Bayesian Weibull Reliability Analysis Approach

Tohru Kaise, Michio Horigome

Article type: Article
2000 Volume 22 Issue 3 Pages 197-202
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_197

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Joint Meeting with JEDEC JC-14

Kazutoshi Miyamoto

Article type: Article
2000 Volume 22 Issue 3 Pages 203-210
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_203

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Acceleration Test Guideline for Semiconductor Devises EIAJ Semiconductor Reliability Subcommittee

[in Japanese]

Article type: Article
2000 Volume 22 Issue 3 Pages 211-222
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_211

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Impression of JCO Critical Accident

Tsuneo Hamano

Article type: Article
2000 Volume 22 Issue 3 Pages 223-225
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_223

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Memorial of Mr.A

Tadashige Fujikawa

Article type: Article
2000 Volume 22 Issue 3 Pages 226-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_226

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[title in Japanese]

Article type: Appendix
2000 Volume 22 Issue 3 Pages 227-229
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_227

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[title in Japanese]

Article type: Appendix
2000 Volume 22 Issue 3 Pages 230-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_230

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[title in Japanese]

Article type: Appendix
2000 Volume 22 Issue 3 Pages 231-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_231

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[title in Japanese]

Article type: Appendix
2000 Volume 22 Issue 3 Pages 232-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_232

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[title in Japanese]

Article type: Appendix
2000 Volume 22 Issue 3 Pages 233-234
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_233

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An Application of Petri Net to Software Safety Validation at Specification Design and Operation Phases : Application to the Radio-Controlled Traffic Control System on Single Track line

Naohiro MASUDA, Sei TAKAHASHI, Hideo NAKAMURA

Article type: Article
2000 Volume 22 Issue 3 Pages 235-243
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_235

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For the purpose of establishing a safety assessment method, a new trains control system for a single-track line is analyzed from the viewpoint of safety and effectiveness by means of a Petri net modeling analysis. Software safety is the most important and a difficult problem to assure of system safety. To overcome this difficulty a new method named skeleton-check method is introduced. The method, which is a more economic and convenient design diversity method using the output from the specification validation process, generates a skeleton-check routine independent of the application programs. The merit of the method is being able to find errors made by deviating from the specification, because of being always confirmed that the movement of the system is in the specification validation process.

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[title in Japanese]

Article type: Cover
2000 Volume 22 Issue 3 Pages Cover2-
Published: March 25, 2000
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.22.3_Cover2

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