The Journal of Reliability Engineering Association of Japan

Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697

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Volume 24, Issue 5

Displaying 1-26 of 26 articles from this issue

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[title in Japanese]

Article type: Cover
2002Volume 24Issue 5 Pages Cover1-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_Cover1

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages i-vi
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_i

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[title in Japanese]

Article type: Index
2002Volume 24Issue 5 Pages vii-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_vii

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[title in Japanese]

Article type: Index
2002Volume 24Issue 5 Pages viii-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_viii

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Miscellaneous Impressions about "Reliability" and "Safety"

Sakae NAGAOKA

Article type: Article
2002Volume 24Issue 5 Pages 361-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_361

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Think of the late Prof. KAWASAKI

Michio HORIGOME

Article type: Article
2002Volume 24Issue 5 Pages 362-363
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_362

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Fundamentals of Micro-Joining Used in Electronics Assembly and its Quality and Reliability(Reliability Test)

Kozo FUJIMOTO

Article type: Article
2002Volume 24Issue 5 Pages 364-373
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_364

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Pitfalls on Reliability Testing(Reliability Test)

Akihiko MASUDA

Article type: Article
2002Volume 24Issue 5 Pages 374-380
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_374

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Reliability of Mounting Technology at Consumer Products(Reliability Test)

Yoshikuni TANIGUCHI

Article type: Article
2002Volume 24Issue 5 Pages 381-388
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_381

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A Principle on Reliability Study of Lead-Free PCB(Reliability Test)

Sadanori ITO

Article type: Article
2002Volume 24Issue 5 Pages 389-399
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_389

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Consideration of the China Reliability Technology : From the Paper of 5th International Conference on Reliability(Reliability Test)

Nobuyuki TAHARA

Article type: Article
2002Volume 24Issue 5 Pages 400-410
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_400

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Concept and Practice of Combined Environmental Reliability Test(CERT)(Reliability Test)

Shigeharu YAMAMOTO

Article type: Article
2002Volume 24Issue 5 Pages 411-420
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_411

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Semiconductor Devices Reliability (FAQ)(Tutorial)

Hiroshi OZAKI

Article type: Article
2002Volume 24Issue 5 Pages 421-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_421

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The Report of IEC/TC56/WG1 : Dependability Terminology Warsaw Meeting(From Overseas)

Kuniomi NAKAMURA

Article type: Article
2002Volume 24Issue 5 Pages 422-427
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_422

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Associate with a Preface by Vice-President, Prof. Mukaidono(Salon)

Tuneo HAMANO

Article type: Article
2002Volume 24Issue 5 Pages 428-431
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_428

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Report of the 10th Annual Symposium on Reliability

[in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japane ...

Article type: Article
2002Volume 24Issue 5 Pages 432-437
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_432

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Activity Report of the Functional Safety Research Group

Hiroshi WADA

Article type: Article
2002Volume 24Issue 5 Pages 438-444
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_438

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages 445-446
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_445

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages 447-466
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_447

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages 467-470
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_467

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages 471-474
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_471

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages 475-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_475

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages 476-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_476

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[title in Japanese]

Article type: Appendix
2002Volume 24Issue 5 Pages 477-480
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_477

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Reliability of Dual Counter-Rotating Ring Networks with Station-Bypass Switches

Hisashi Yamamoto, Yoshiaki Mizuno

Article type: Article
2002Volume 24Issue 5 Pages 481-491
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_481

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A dual counter-rotating ring network system consists of the terminals located in a ring. Each terminal has self-heal and station-bypass switches as back-up functions. In this paper, we consider s terminal reliability in a dual counter-rotating ring network system with optical power loss. We suppose a station-bypass switch sometimes fails and we prove s terminal reliability in a dual counter-rotating ring network system can be expressed by a reliability of a consecutive-k, r-out-of-n: DFM system. Then, we propose 2 kinds of recursive formulas and a closed formula for s terminal reliability.

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[title in Japanese]

Article type: Cover
2002Volume 24Issue 5 Pages Cover2-
Published: July 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.5_Cover2

JOURNAL FREE ACCESS

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