The Journal of Reliability Engineering Association of Japan

Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697

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Volume 24, Issue 1

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[title in Japanese]

Article type: Cover
2002 Volume 24 Issue 1 Pages Cover1-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_Cover1

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[title in Japanese]

Article type: Appendix
2002 Volume 24 Issue 1 Pages i-vi
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_i

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[title in Japanese]

Article type: Index
2002 Volume 24 Issue 1 Pages vii-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_vii

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[title in Japanese]

Article type: Index
2002 Volume 24 Issue 1 Pages viii-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_viii

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At the Beginning of This Year

Michio HORIGOME

Article type: Article
2002 Volume 24 Issue 1 Pages 1-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_1

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Weibull Distribution and Failure Mechanism

Hiroshi OZAKI

Article type: Article
2002 Volume 24 Issue 1 Pages 2-7
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_2

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Reliability Test Method based on Failure Mechanism of LSI

Hideya MATSUYAMA

Article type: Article
2002 Volume 24 Issue 1 Pages 8-13
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_8

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The Trend of Standardization and Harmonization of Semiconductor Reliability Test Methods

Masaki TANAKA

Article type: Article
2002 Volume 24 Issue 1 Pages 14-20
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_14

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JEITA Standard EIAJ EDR-4701B Handling Guidance for Semiconductor Devices

Semiconductor Devices Reliability Subcommittee, Semiconductor Devices ...

Article type: Article
2002 Volume 24 Issue 1 Pages 21-29
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_21

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A Study of Relative Humidity in Dray Packing and Highly Accelerated Water Absorption Method on Semiconductor Device

Hiroshi MATSUSHIMA, Tetsuaki WADA

Article type: Article
2002 Volume 24 Issue 1 Pages 30-36
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_30

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Reliability Estimation Method for Humidity Stress on Semiconductor Device

Tetsuaki WADA

Article type: Article
2002 Volume 24 Issue 1 Pages 37-45
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_37

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Reliability Estimation Method for Electromigration on Semiconductor Device

Shinji NAKANO, Tetsuaki WADA

Article type: Article
2002 Volume 24 Issue 1 Pages 46-56
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_46

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A Study of the Reliability Estimation Method for System LSI Products

Hideyuki OCHIAI

Article type: Article
2002 Volume 24 Issue 1 Pages 57-62
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_57

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Frequently Asked Questions and Answers in Reliability

Takeshi NATSUME

Article type: Article
2002 Volume 24 Issue 1 Pages 63-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_63

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A Case pf Systematic Failures of the H2 Rocket Project

Takeshi NATSUME

Article type: Article
2002 Volume 24 Issue 1 Pages 64-65
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_64

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The Report of IEC/TC56-Dependability Oslo Meeting(From Overseas)

Kuniomi NAKAMURA, Takeshi NATSUME, Katsushige ONODERA, Akihiko MASUDA

Article type: Article
2002 Volume 24 Issue 1 Pages 66-76
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_66

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Visiting Report of "Hitachi, Ltd. Data Storage System Division"

Tsuneo HAMANO

Article type: Article
2002 Volume 24 Issue 1 Pages 77-80
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_77

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Report of REAJ 14th Reliability Symposium

Shigeharu YAMAMOTO, Kazuyuki SUZUKI, Katsuhiko HOSODA, Shinichiro YOKO ...

Article type: Article
2002 Volume 24 Issue 1 Pages 81-91
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_81

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[title in Japanese]

Article type: Appendix
2002 Volume 24 Issue 1 Pages 92-93
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_92

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[title in Japanese]

Article type: Appendix
2002 Volume 24 Issue 1 Pages 94-95
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_94

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[title in Japanese]

Article type: Appendix
2002 Volume 24 Issue 1 Pages 96-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_96

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[title in Japanese]

Article type: Appendix
2002 Volume 24 Issue 1 Pages 97-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_97

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[title in Japanese]

Article type: Appendix
2002 Volume 24 Issue 1 Pages 98-100
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_98

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Parameter estimation in competing risks model with environmental stress using masked and censored data

Yoshimitsu NAGAI

Article type: Article
2002 Volume 24 Issue 1 Pages 101-115
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_101

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To assess reliability, it is an important problem to estimate parameters of failure time distributions of components. We consider a competing risks model under environmental stress with censoring. It is not always possible to identify the cause of failure in field data. In this paper, we describe two components series system which incorporates environmental stress when the probability that the cause of failure cannot be identified depend on which component actually fails. We give an estimation procedure using masked and censored data based on a two-stage procedure. By a simulation study, we find, for example, that the relative errors decrease in inverse proportion to the square root of the expected number of systems whose cause of failure is identified.

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[title in Japanese]

Article type: Cover
2002 Volume 24 Issue 1 Pages Cover2-
Published: January 25, 2002
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.24.1_Cover2

JOURNAL FREE ACCESS

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