The Journal of Reliability Engineering Association of Japan

Online ISSN : 2424-2543
Print ISSN : 0919-2697
ISSN-L : 0919-2697

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Volume 25, Issue 8

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[title in Japanese]

Article type: Cover
2003 Volume 25 Issue 8 Pages Cover1-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_Cover1

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages i-ix
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_i

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[title in Japanese]

Article type: Index
2003 Volume 25 Issue 8 Pages xi-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_xi

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[title in Japanese]

Article type: Index
2003 Volume 25 Issue 8 Pages xii-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_xii

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My Wishes for the Journal of REAJ

Kazuhisa HAEIWA

Article type: Article
2003 Volume 25 Issue 8 Pages 703-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_703

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The Information System for a Publishing Business (Special Survey Information System and Reliability)

Masaki MORI, Masayuki ISHIDA

Article type: Article
2003 Volume 25 Issue 8 Pages 704-709
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_704

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Convenience Store POS System and Reliability (Special Survey Information System and Reliability)

Mitsuaki USUI

Article type: Article
2003 Volume 25 Issue 8 Pages 710-717
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_710

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Development and Introduction of JR East Contact-less IC Card Automatic Fare Collection System Suica (Special Survey Information System and Reliability)

Akio SHIIBASHI

Article type: Article
2003 Volume 25 Issue 8 Pages 718-727
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_718

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Reliability of Web Services System on Travel Industry (Special Survey Information System and Reliability)

Kenichi YAJIMA

Article type: Article
2003 Volume 25 Issue 8 Pages 728-734
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_728

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The Alarm Security Network System Adopted by Some Security Company in Tokyo (Special Survey Information System and Reliability)

Kenji ITOH

Article type: Article
2003 Volume 25 Issue 8 Pages 735-739
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_735

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Delayed Fleet by Air Traffic Flow Management and Actual Operation Rate (Special Survey Information System and Reliability)

Sachiko FUKUSHIMA

Article type: Article
2003 Volume 25 Issue 8 Pages 740-747
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_740

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Gas Production and Distribution Network System Reliability (Special Survey Information System and Reliability)

Kazuo KOYAMA, Daisuke TAKAGI, Akinori ISHIZUKA, Katsunori KAWAI

Article type: Article
2003 Volume 25 Issue 8 Pages 748-755
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_748

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New P-S-N Curve and Application for Machine Design

Shigeo SHIMIZU

Article type: Article
2003 Volume 25 Issue 8 Pages 756-767
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_756

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Semiconductor Devices Reliability (FAQ)

Hiroshi OZAKI

Article type: Article
2003 Volume 25 Issue 8 Pages 768-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_768

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Report of the Technical Meeting of REAJ Kansai Branch

Tadashi MURATA

Article type: Article
2003 Volume 25 Issue 8 Pages 769-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_769

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 770-771
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_770

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 772-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_772

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 773-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_773

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 774-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_774_1

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 774-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_774_2

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[title in Japanese]

Article type: Index
2003 Volume 25 Issue 8 Pages 775-780
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_775

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 781-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_781

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 782-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_782

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Survey of Reliability Studies of Multi-dimensional Consecutive-k-out-of-n:F Systems

Hisashi Yamamoto, Tomoaki Akiba

Article type: Article
2003 Volume 25 Issue 8 Pages 783-796
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_783

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The linear and circular consecutive-k-out-of-n:F systems (one-dimensional systems) have been extensively studied since the early 1980s. For the first time, Two-dimensional consecutive-k-out-of-n:F systems have been introduced at 1990 by Salvia and Lasher. In this paper, we review studies on evaluating the reliability of multi-dimensional consecutive-k-out-of-n:F systems. Especially, we consider mainly the other systems except connected-(r, s)-out-of-(m, n):F lattice systems, which are typical systems of two-dimensional consecutive-k-out-of-n:F systems.

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Mechanism of Firing of Aluminum Electrolytic Capacitors and Solutions

Toshinori Watabe, Yoshichika Fujiwara, Manabu Takeuchi

Article type: Article
2003 Volume 25 Issue 8 Pages 797-809
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_797

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When DC overvoltages were applied to aluminum electrolytic capacitors for smoothing in the primary circuit in the switching power supply, approx. 14% of capacitors were shorted, and fired simultaneously with the explosion-proof vent functioning. Shorted portions were winding core, periphery, foil edge and lead. DC overvoltage breaks the oxide film to cause short-circuit current. Heat generated by the internal resistance evaporates the electrolyte, increasing the internal pressure to operate the explosion-proof vent. Expansion force of the capacitor element results in short-circuit and sparks simultaneously in either of the four portions, which ignites vaporized gas and fires the capacitor. Solution is to provide a construction which will not cause short-circuit.

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Electromigration Lifetime Test in Damascene Copper Interconnects using Sudden Death Test Structure and OBIRCH

Shinji YOKOGAWA

Article type: Article
2003 Volume 25 Issue 8 Pages 811-820
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_811

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The bimodal electromigration lifetime of damascene Cu interconnects was investigated by using a new sudden death test structure. Parameter estimation by the test structure is highly superior to that of non-sudden death approach even with a small sample size. In addition, the test structure shortens the reliability test period of electromigration. The test structure was amenable to failure analysis tools such as OBIRCH. Early failure was due to the void growth in the bottom of Via. Intrinsic failure was due to the void growth under Via.

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 821-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_821

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 823-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_823

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 825-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_825

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 826-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_826

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[title in Japanese]

Article type: Appendix
2003 Volume 25 Issue 8 Pages 827-828
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_827

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[title in Japanese]

[in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 829-832
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_829

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 833-836
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_833

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[title in Japanese]

[in Japanese], [in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 837-840
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_837

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Article type: Article
2003 Volume 25 Issue 8 Pages 841-844
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_841

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2.2 Influence of hydrogen near the SiO_2/Si interface on long-term reliability of LSI (Proceedings of 16^<th> Reliability Symposium)

Ziyuan LIU, Shinji FUJIEDA, Koichi TERASHIMA

Article type: Article
2003 Volume 25 Issue 8 Pages 845-848
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_845

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It was confirmed that negative-bias-temperature stress (NETS) produces interface states and a post-oxidation annealing (POA) suppresses the interface state production. Hydrogen accumulation to the SiO_2/Si interface is clearly shown to influence the stability of LSI's devices against NETS.

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 849-852
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_849

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[title in Japanese]

[in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 853-856
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_853

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[title in Japanese]

[in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 857-860
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_857

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3.3 Faulty Diagnosis Technique in Cell Circuit Using I_<DDQ> (Proceedings of 16^<th> Reliability Symposium)

Masaru SANADA, Kazuo UEHIRA

Article type: Article
2003 Volume 25 Issue 8 Pages 861-864
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_861

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For fault element diagnosis in cell circuits, two diagnosis techniques have been developed using I_<DDQ>. One is a detection way of shorted pairs in transistor elements. This technique is the way to prepare logic state of six pairs, formed by transistor structure, using the logic applied to transistor terminal. Another is a detection way of shorted line pairs in cell circuit. Transistor is defined to logical element and treats as SPICE data. This operation makes it possible to execute the logic simulation of elements in cell. These data combined with layout information are applied to narrow the shorted pairs down.

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[title in Japanese]

[in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 865-868
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_865

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[in Japanese], [in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 869-872
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_869

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 873-876
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_873

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Article type: Article
2003 Volume 25 Issue 8 Pages 877-880
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_877

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[title in Japanese]

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Article type: Article
2003 Volume 25 Issue 8 Pages 881-884
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_881

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 885-888
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_885

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese]

Article type: Article
2003 Volume 25 Issue 8 Pages 889-892
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_889

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[title in Japanese]

[in Japanese], [in Japanese], [in Japanese], [in Japanese], [in Japane ...

Article type: Article
2003 Volume 25 Issue 8 Pages 893-896
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_893

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[title in Japanese]

Article type: Cover
2003 Volume 25 Issue 8 Pages Cover2-
Published: November 25, 2003
Released on J-STAGE: February 26, 2018

DOIhttps://doi.org/10.11348/reajshinrai.25.8_Cover2

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