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Volume 1960 (1960)
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Volume 1960, Issue 16
Displaying 1-6 of 6 articles from this issue
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Ichikazu Hayase1960 Volume 1960 Issue 16 Pages 1-10
Published: December 31, 1960
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSDownload PDF (1641K) -
Isao Takeshita, Keizo Morikawa1960 Volume 1960 Issue 16 Pages 11-19
Published: December 31, 1960
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSDie Aberration zweiter Ordnung im Mattauch-Herzogschen Apparat hangt vom Abstand(d) der elektrischen und magnetischen Ablenkfelder, der Lage(d')der Blende zwischen beiden Feldern und dem Radius(γm) im Magnetfeld ab. Wir berechnen numerisch diese Aberrationen mit Hilfe der Hintenbergerschen Formel fur Bildfehler, und diskutieren uber die Grossen dieser Parameter(d, d', γm), um die Bildfehler moglichst gering zu machen.View full abstractDownload PDF (895K) -
Masami Michijima, Jun Okano, Masayuki Gotoh, Koreichi Ogata1960 Volume 1960 Issue 16 Pages 20-29
Published: December 31, 1960
Released on J-STAGE: March 01, 2011
JOURNAL FREE ACCESSA 12-stage Cu-Be electron multiplier tube was constructed and mounted in the high vacuum mass spectrometer at Osaka University. The following improvements for the construction, comparing with the similar tube previously reported, were made: 1)plane electrodes for deflecting the ion beam injecting the conversion dynode of multiplier were located behind the defining slit, 2)The several dynodes near the top of the tube were covered by a permalloy cylinder for shielding stray magnetic field of the magnet. The output current of multiplier was measured by a vibrating reed electrometer. As the results of the preliminary investigation of multiplier characteristics, the shape and height of mass peaks were found to be considerably affected by the voltage supplying on the deflecting electrodes and the proper voltage depended on the ion energy. The stability of multiplier gain(∼6×103)was fairly sufficient for measuring isotope ratio. For example, the measured 20Ne/22Ne ratio was 10. 563±0.006(not corrected for mass discrimination). At the ultimate pressure in the mass spectrometer, the background mass spectra up to m/e∼150 were recorded and some hydrocarbon fragment peaks corresponding to 10-16-10-18 amps. were found in C2-C7 region. And mass peaks below 10-16 amps. show very fluctuated top, but such statistical fluctuation could be smoothed out by using the amplifying system with sufficiently time constant and low speed scanning. Under such condition, the ion current down to 1-2×10-19 amps. could be detected the noise level of amplifying system.kn-abstract=View full abstractDownload PDF (14843K) -
Isao Takeshita, Fusafumi Nakao1960 Volume 1960 Issue 16 Pages 30-35
Published: December 31, 1960
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSThe emission regulator circuit for ionization gauge is analytically investigated particularly on the regulation range using the ideal transformer approximation. The simple formulae for transformer design which fulfils the given condition of regulation range are derived and the adaptation of vacuum tubes for his circuit is discussed. Reference is made to the effect of no-load current. The validity of our formulae is experimentally confirmed.View full abstractDownload PDF (764K) -
Yoshihide Naito, Yoichi Chitani1960 Volume 1960 Issue 16 Pages 35-37
Published: December 31, 1960
Released on J-STAGE: March 01, 2011
JOURNAL FREE ACCESSA coil of tungsten filament was placed in an aqueous solution of uranyl nitrate(ca. 1 mg uranyl nitrate per 1 ml water)and a platinum ribbon was placed in a dilute(ca. 1%)sodium carbonate solution, both solutions were separated by an anion exchange membrane. These solutions were electrolyzed(cathod: tungsten filament, anode: platinum ribbon, current density: 0.03-0.08 amp/;cm2)then uranium oxide was deposited on the surface of the tungsten filament in the form of homogeneous vitreous film of orange color. This uranium oxide coated tungsten filament was found to give steady ion currents of uranium in the single filament ion source of the mass spectrometer even when the temperature of the filament was relatively rapidly(ca. 30° per min.)increased.View full abstractDownload PDF (412K) -
Toshio Sugiura, Teruo Hayakawa1960 Volume 1960 Issue 16 Pages 37-44
Published: December 31, 1960
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSThe secondary electron emission from the non-activated(electro-polished) and activated surfaces of copper-beryllium(4%) by bombardments of various noble gas and hydrocarbon ions was studied together with the measurements of the surface structure by means of electron diffraction analysis. Considerably thick layer of beryllium oxide was formed in the neighbourhood of the target surface activated by dry oxygen at the temperature range of 350 to 480°C. On the other hand, the oxide films of copper were formed on the target surface by electropolishing, and these oxide films easily undergone to the reduction by the prolonged ion bombardments. The optimum temperature of activation by dry oxygen for the secondary electron yield seems to lie about 420°C, and the secondary electron yield for the activated target surface treated at 350 or 420°C is only slightly dependent upon the ion kinetic energy. No measurable decrease in the electron yield for the activated surface treated at 420°C was obtained by prolonged bombardments of various positive ions about ten hours, while the electron yield for the non-activated(electro-polished) target decreased about 20 percent by the prolonged bombardments of ions for five hours. Under the present experimental conditions, the mechanism of the electron ejection process seems to be considerably complicated and it is difficult to deduce any definite conclusion for the electron ejectionView full abstractDownload PDF (1067K)
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