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Volume 26 (1978)
- Issue 4 Pages 301-
- Issue 3 Pages 209-
- Issue 2 Pages 113-
- Issue 1 Pages 1-
Volume 26, Issue 1
Displaying 1-10 of 10 articles from this issue
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II. The Rrinciples and Application of High Pressure Mass SpectrometerKenzo Hiraoka1978 Volume 26 Issue 1 Pages 1-17
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSDownload PDF (2047K) -
Sigeo Baba1978 Volume 26 Issue 1 Pages 19-34
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSDownload PDF (1391K) -
Yozaburo Kaneko, Tetsuo Koizumi, Nobuo Kobayashi1978 Volume 26 Issue 1 Pages 35-52
Published: March 31, 1978
Released on J-STAGE: March 01, 2011
JOURNAL FREE ACCESSThis paper is a compilation of the ionic mobility data measured with the injected-ion drift tube mass spectrometer in Tokyo Metropolitan University till the end of 1977. The reduced mobilities are presented as a function of the ratio of the electric field strength to the gas density, E/N. The ratio ranges from a few Td (10-17volt·cm2) to few hundreds Td. The mobilities compiled here are as follows;
in He; Li+, Ne+, Ar+, Kr+, N+, O+, N2+, CO+, CO2+ and N20+,
in Ne; CO2+, N20+,
in Ar; Li+, Kr+, CO2+ and N20+,
in N2; Li+, Kr+, CO2+ and N20+,
in CO2; Li+, NO+ and 02+. These mobility data are not only useful for the dirft tube study of ion-neutral reactions.but also providing the important information about the interaction potentials between the ions and the gas molecules.View full abstractDownload PDF (896K) -
Isao H. Suzuki, Kogoro Maeda1978 Volume 26 Issue 1 Pages 53-60
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSIonization efficiency curves of atomic and molecular hydrogen ions from acetylene, ethylene and ethane have been measured over the energy ranges near their appearance thresholds by using a monoenergetic electron beam. The appearance potentials for the ions were determined with the Initial Onset method, and some of them were confirmed with the Straightening-through-Smoothings method. The determined values are not always in agreement with those by the Vanishing Current method. Barrier energies for formation of these ions were estimated and the energies are much higher than those of larger fragment ions.View full abstractDownload PDF (572K) -
Cross Sections of He+with Ar in the Low Energy RegionToshiaki Ishikawa, Hokotomo Inouye1978 Volume 26 Issue 1 Pages 61-65
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSLow-energy peak which appears in the energy dependence of total emission cross sections of light from the(3s 3p6)2S state of Ar+produced in charge transfer collisions of He+with Ar is accounted for on the basis of multi-channel systems. Calculation shows that the presence of “gecliptic”channel which crosses both the potential curves for the initial and the final states is essential to reproduce the profile of the low energy peak satisfactorily.View full abstractDownload PDF (452K) -
Isao Nishi, Giichi Tomizawa, Lumi Tatsuta1978 Volume 26 Issue 1 Pages 67-82
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSThe function of the sytem is to determine step voltages for scanning gases to bemeasured, and to make simultaneous and continuous measurement of the specified mass ions by a rapid and repeated supply of the step voltages and gate pulses. The system is composed of a microcomputer scanning system and an analogue gate assembly. The microcomputer system is composed of an A/D converter(ADC550-10-E), a D/A converter(DAC371V-8)and a SDK-80system(8080CPU, ROM2KB, RAM1KB and a programmable peripheral interface 8255). The 8255 plays an important role as an I/O port in the construction of the interface. The design construction of the system is illustrated and the operation of the system is described in details. Some technical points are examined and discussed on how to specify the scanning step voltages, and on how to adjust or maintain the optimum step voltages.View full abstractDownload PDF (1560K) -
Yoshiaki Okajima, Yukiyoshi Aizawa1978 Volume 26 Issue 1 Pages 83-87
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSThe sputtering rates of chromium, copper, germanium and gold films, which were prepared by a vacuum deposition method, were measured after oxygen ion bombardment. was found that sputtering rates are proportional to the current density of primary oxygen ions. This relation can be used to determine the depth of a sputtered surface when beam parameters change, and allows to obtain the compositional depth profile of multi-layer metal films, prepared by vacuum deposition.View full abstractDownload PDF (1286K) -
Shunroku Taya1978 Volume 26 Issue 1 Pages 89-95
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSThe kinetic energy distribution of ions liberated from a silicon wafer surface was measured. The primary ion was 8 keV O+. The energy distribution was analyzed using electric toroidal sector(re=212mm, φe=85°, c=0.5). Two new sharp energy peaks have been observed immediately below a giant sputtered ion peak. These energetically discrete sputtered ions were analyzed with a double focusing mass spectrometer. From the results of SIMS analyses, ions of the lowest energy peak have been identified as the ambient gas ions, ions of the next higher energy peak as those from the top surface, and ions of the giant energy peak as those from the bulk.View full abstractDownload PDF (1511K) -
Mitsuo Uchida, Takeo Higashino, Noriaki Shimada, Eisaku Hayashi1978 Volume 26 Issue 1 Pages 97-104
Published: March 31, 1978
Released on J-STAGE: July 05, 2011
JOURNAL FREE ACCESSMass spectra of p-(tolylsulfonyl)diazines(Ar-SO2-C6H4-CH3, I) were examined. The molecular ion (M+) of I seems to undergo the migration to form the rearranged molecular ion of p-tolyl diazinesulfinate(M1) or that of diazinyl p-toluenesulfinate(M2). The general fragmentation patterns of M+, M1+ or M2+ are summarized by some pathways. The principal fragments of I are C7H7+ formulated as the tropylium ion, Ar+ formed by the loss of p-tolylsulfonyl group from M+, C7H7 and ArC7H7+ yeilded by the expulsion of sulfur dioxide from M+. It shows that the principal fragmentation of I proceeds by the pathway having the stable fragment ions.View full abstractDownload PDF (764K) -
Masaya Iwanaga, Kiyoshi Hosoi, Shozo Onishi1978 Volume 26 Issue 1 Pages 105-112
Published: March 31, 1978
Released on J-STAGE: June 28, 2010
JOURNAL FREE ACCESSThree kind of isomers of xylene and ethylbenzene were analyzed using a gas chromatogrph-chemical ionization mass spectrometer with mass fragmentograhy technique to find any difference between these isomers in the various conditions, such as different reagent gases(CH4, i-C4H10 and NH3)and ion source temperature(200°C∼280°C). With iso-buthane as a reagent gas, the peak intensity of m/e 107(QM+)and the peak intensity ratio of m/e 106 to m/e 107 show remarkable differences between m-xylene and the other isomers at 200°C of the ion source temperature, and the differences decrease with increasing temperature. With ammonia as a reagent gas, the peak intensity of m/e 106 and the peak intensity ratio of m/e 108 to m/e 106 show much differences between p-xylene and the other isomers, and the differences are unchanged by the ion source temperature 200°∼280°C. Peak intensity ratio of m/e 105 to m/e 107 of ethylbenzene is much higher than the one of xylene isomers with iso-buthane as a reagent gas at 200°C of ion source temperature, and the differences decrease with increasing temperature.View full abstractDownload PDF (750K)
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