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A machining aspect of A5052 polished in ultraviolet-ray irradiation
Takeshi Tanaka
Session ID: Q70
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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We have tried to process many materials by acting the oxidization/reduction reactions of electron and hole provided by irradiating an ultraviolet ray on photocatalyst and fluorescent substance, and by applying the mechanical scratch action of photocatalyst and abrasive grit. A fundamental work of an ultraviolet-ray aided machining study verifies the polishing phenomena of A5052. The XPS qualitative analysis estimates the chemical reaction induced on Al-surface that was dipped in some solutions. The TXRF analyses the elements on a surface of A5052. The ICPS quantitatively analyses the oxidation/dissolution volume of Al, Mg and Fe. The following conclusions are obtained by discussing a polishing process of A5052. Aluminum does not resolve into TiO
2-solution, and the change of A5052-surface is small in polishing with TiO
2-slurry. Aluminum merely resolves in Cathilon-solution, and polishing with Cathilon-slurry provides a small change of A5052-surface. Though a little volume of Al resolves in TiO
2-Cathilon solution forming the chloride in ultraviolet-ray irradiation, the oxide, nitrogen oxide and nitride form on Al-surface. TiO
2-Cathilon slurry makes flat A5052-surface in polishing in ultraviolet-ray irradiation.
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A study on increase in polishing rate
Kazuya Yamamura, Kenji Hosoya, Hui Deng, Yusuke Imanishi, Katsuyoshi E ...
Session ID: Q74
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Evaluation of the polishing characteristics of CVD-SiC used for optical molds
Hui Deng, Yusuke Imanishi, Katsuyoshi Endo, Kazuya Yamamura
Session ID: Q75
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Optimization of the surface modification conditions of GaN in plasma-assisted polishing
Hui Deng, Katsuyoshi Endo, Kazuya Yamamura
Session ID: Q76
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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A proposal of smoothing model based analysis of surface terminations by XPS and FTIR-ATR
Takaaki Tabata, Hisaya Dojo, Katsuyoshi Endo, Hideaki Yamada, Akiyoshi ...
Session ID: Q77
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Yusuke Imanishi, Katsuyoshi Endo, Kazuya Yamamura
Session ID: Q78
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Takashi Sawai, Hitoshi Suwabe, Ken-ichi Ishikawa
Session ID: Q80
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Shuuta Shibata, Hitoshi Suwabe, Ken-ichi Ishikawa
Session ID: Q81
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Masashi Yamaguchi, Naomichi Furushiro, Daisuke Hirooka, Tomomi Yamaguc ...
Session ID: Q82
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Urara Satake, Kousuke Matsuda, Toshiyuki Enomoto
Session ID: Q83
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Masaru Murakami, Masahiro Anzai
Session ID: R00
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Relationship between Cutting Force and Wear Behavior of Cutting Tool
Sosuke Korenaga, Hirofumi Oosawa, Toshiaki Uematsu, Yoshinori Itoh, Hi ...
Session ID: R01
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Tetsuo Fujimoto, Akira Hosokawa, Tatsuaki Furumoto, Tomohiro Koyano, K ...
Session ID: R02
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Tatsuya Furuki, Toshiki Hirogaki, Eiichi Aoyama, Keiji Ogawa, Kiyofumi ...
Session ID: R03
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Ken Goto, Jun Shinozuka
Session ID: R04
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Daiki Matsunaga, Masahiko Onosato, Fumiki Tanaka
Session ID: R06
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Kazuya Hamaguchi, Hiroyuki Kodama, Koichi Okuda
Session ID: R07
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Takenori OONO
Session ID: R08
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Takenori OONO
Session ID: R09
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Mikiya Hara, Jiang Zhu, Tomohisa Tanaka, Hayato Yoshioka, Yoshio Saito
Session ID: R11
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Yuya Sudo, Kenichiro Horio, Junichi Kaneko, Tsugio Yamasaki
Session ID: R12
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Jun Shinozuka, Yuichi Imakama
Session ID: R13
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Taito Osaka, Takashi Hirano, Yuichi Inubushi, Makina Yabashi, Yasuhisa ...
Session ID: R30
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
CONFERENCE PROCEEDINGS
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Takumi Goto, Hiroki Nakamori, Satoshi Matsuyama, Takashi Kimura, Krish ...
Session ID: R31
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Shuhei Yasuda, Satoshi Matsuyama, Hidetoshi Kino, Hiromi Okada, Shinya ...
Session ID: R32
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Yoko Takeo, Hiroto Motoyama, Yasunori Senba, Haruhiko Ohashi, Hidekazu ...
Session ID: R33
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Hiroto Motoyama, Takahiro Sato, Atsushi Iwasaki, Satoru Egawa, Kaoru Y ...
Session ID: R34
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Satoshi Matsuyama, Ayumi Kime, Takumi Goto, Akihiko Nishihara, Yosiki ...
Session ID: R36
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Jangwoo Kim, Satoshi Matsuyama, Yasuhisa Sano, Kazuto Yamauchi
Session ID: R37
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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X-rays generated by a light source are guided to the experimental apparatus using several X-ray optical devices, such as mirror optics, monochromators, refractive lenses, and so on. A mirror is one of the most widely used optical devices, and the surface shape of the mirror significantly affects the quality of X-rays at the sample position. Plane or nearly plane surfaces can be measured by, for example, using an interferometer and a slope profiler. However, focusing mirrors used for soft X-ray focusing and single-nanometer hard X-ray focusing have significantly small curvature radii of a few meters. It is difficult to measure the shapes of these mirrors using conventional methods. We have developed a novel measurement system that uses a laser focus microscope as a probe for measuring steeply curved mirrors.
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Takahiro Higashi, Yoshinori Takei, Takahiro Saito, Takehiro Kume, Hide ...
Session ID: R38
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Jumpei Yamada, Satoshi Matsuyama, Yasuhisa Sano, Kazuto Yamauchi
Session ID: R39
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Takehiro Kume, Satoru Egawa, Hidekazu Mimura
Session ID: R43
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Processing of the single crystal diamond substrate in size of about 1 cm2
Akihisa Kubota, Takahiro Takita, Mutsumi Touge
Session ID: R44
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Akihisa Kubota, Shin Nagae, Shuya Motoyama, Mutsumi Touge
Session ID: R45
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Sho Urakawa, Kazuaki Oda, Takesi Sakamoto, Hiroyuki Yokoi, Mutsumi Tou ...
Session ID: R46
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Kiyoshi Yasutake, Takahiro Yamada, Hiroaki Kakiuchi, Hiromasa Ohmi
Session ID: S01
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Takahiro Adachi, Mitsutoshi Shuto, Takahiro Yamada, Hiromasa Ohmi, Hir ...
Session ID: S02
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Takayuki Sakaguchi, Weicheng Lin, Shogo Tamaki, Takahiro Yamada, Hirom ...
Session ID: S03
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Masashi Takata, Akira Okada, Yasuhiro Okamoto, Motohiro Inoue, Sadao S ...
Session ID: S04
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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In our previous studies, the possibility of thin ceramic film formation by using a large-area EB irradiation was shown. However, the film formation mechanism has not yet been clarified. In this report, the influences of magnetic and electrical conductivity of a jig supporting an alumina target tube on the film formation were investigated, and the spectrum of plasma generated on the substrate surface during the EB irradiation was measured in order to clarify the mechanism. As a result, it was made clear that the film was formed by sputtering target material with the plasma of workpiece material caused by EB Irradiation.
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Akira Funahashi, Ryota Takamura, Ikuo Azuma, Eiji Sasamoto, Hiroki Aka ...
Session ID: S06
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Unkai Sato, Hideki Kawakubo
Session ID: S07
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Shinji Arai, Takashi Hosono, Kazuhiko Sakaki
Session ID: S08
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Akira Sakaguchi, Masayuki Nakano, Junko Hieda, Naoto Ohtake, Hiroki Ak ...
Session ID: S09
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Atsushi Ezura, Hikaru Yoshimine, Kazutoshi Katahira, Jun Komotori
Session ID: S13
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Shotaro Ando, Yuko Aono, Atsushi Hirata
Session ID: S14
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Yutaka Yasoda, Yasutomo Uetsuji, Kazuyoshi Tsuchiya
Session ID: S15
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Kei Ito, Kazuyoshi Tsuchiya, Yasutomo Uetsuji
Session ID: S16
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Takumu Yamaguchi, Keisuke Nagato, Tatsuya Mimura, Shinichi Hasegawa, M ...
Session ID: S18
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Application to high adhesion between polytetrafluoroethylene and metal film
Yuji Ohkubo, Haruka Sato, Kento Ishihara, Tomonori Aoki, Katsuyoshi En ...
Session ID: S19
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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Saurabh Bhide, Jiang Zhu, Hayato Yoshioka, Tomohisa Tanaka, Yoshio Sai ...
Session ID: T18
Published: March 01, 2015
Released on J-STAGE: September 01, 2015
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In this paper, an approach is presented for finding an intersection curves between triangulated mesh (designed geometry) and point cloud data (acquired geometry). We use projection based Moving Least Squares (MLS) surface as the underlying surface representation for acquired point-sampled geometry. This phase can be viewed as first step towards direct Boolean operation between such meshed surface and point cloud data. Based on MLS surface definition, an algorithm is developed to find the intersection point between plane and MLS surface. We then extend this algorithm to intersect entire mesh model with point cloud. Once intersection points are known it is possible to carry out Boolean operation and generate hybrid model.
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