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So Ito, Taichi Kamata, Kimihisa Matsumoto, Kazuhide Kamiya
Pages
570-571
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Keiya Takahashi, Munetoshi Numada, Yuki Kondo, Ichiro Yoshida, Hiroyas ...
Pages
572-573
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Ren Ichikawa, Hiromasa Kume, Masaki Michihata, Kiyoshi Takamasu, Sator ...
Pages
574-575
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Masaharu Nakano, Yukihiro Ohta, Kaede Okada, Makoto Katoh
Pages
576-577
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Yuki Kondo, Ichiro Yoshida, Munetoshi Numada, Keiya Takahashi, Hiroyas ...
Pages
578-579
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Chikara Odagiri, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
Pages
580-581
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Nobumichi Tsuda, Bohuai Chu, Masaki Michihata, Kiyoshi Takamasu, Sator ...
Pages
582-583
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Motohiro Ihara, Iwao Yamaji, Atsushi Matsubara
Pages
584-585
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Jiaqing Zhu, Terutake Hayashi, Syuhei Kurokawa
Pages
586-587
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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6th report: Displacement verification in the third dimension of single nanoparticle
ARAN BLATTLER, PANART KHAJORNRUNGRUANG, KEISUKE SUZUKI, THITIPAT PERMP ...
Pages
588-589
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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The nanoscale phenomena, such as chemical mechanical polishing (CMP) process, present near the surface. A three-dimensional nanoparticle tracking could explain the phenomena that happen in the polishing process. From our previous report, we have investigated the three-dimensional motion of an individual standard nanoparticle by using optical method, but the height Z on the third dimension was not accurately verified. In this report, the sub-100 nm individual nanoparticles were fixed on the tip which the tip was connected to the piezo actuator for controlling the height Z displacement. The multi-wavelength evanescent fields with optical microscopy system is also applied in the experiment for three-dimensional nanoparticle tracking. The scattering light from nanoparticle will exponentially increase when the nanoparticle on the tip was downward moved close to the reference surface. Finally, The height Z uncertainty could be measured approximately ±25 nm and the penetration height measurability were 200 nm far from the reference surface. We could three-dimensionally track the individual standard nanoparticle in recording speed higher than 50 frames per second for exposure time less than 10 milliseconds.
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Masao Nakagawa, Osamu Kobayashi, Tetsuya Niikuni
Pages
590-591
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Naho Fujii, Yonghoon Ji, Kazunori Umeda
Pages
592-593
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Akihito Takeuchi, Fuminobu Kimura, Yusuke Kajihara
Pages
594-595
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Hibiki Shiga, Takanori Yazawa, Tatsuki Otubo, Megumu Kuroiwa
Pages
596-597
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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In recent years, cutting in the medical and industrial fields has been performed using a blade with a small radius of curvature of less than 1μm at the tip of the cutting edge. At present, non-destructive methods for measuring and evaluating shapes have not been established. Therefore, the purpose of this study was to develop a non-destructive three-dimensional shape measuring device for a blade with a complicated shape at the tip of the blade. In this report, we proposed a method for calculating the radius of curvature, developed a device capable of three-dimensional measurement, and confirmed the calculation method and the effectiveness of the device by evaluation experiments.
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Yasuhiko Hara, Hirotaka Tanaka, Kenji Shirai, Junichi Sugano, Yu Hosos ...
Pages
598-599
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Nao Ogura, Yuto Fujimura, Akira Imori, Tomoya Aoki, Takuya Anjiki, Shu ...
Pages
600-601
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Yuta Aoto, Masami Nakamura, Shunji Maeda
Pages
602-603
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Akira Imori, Yuto Hujimura, Nao Ogura, Tomoya Aoki, Takuya Anjiki, Syu ...
Pages
604-605
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Yutaka Otake
Pages
606-607
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Satsuki Shimizu, Gota Yamaguchi, Yoko Takeo, Yukie Nagai, Yutaka Ohtak ...
Pages
608-609
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Junta Kono, Yutaka Ohtake, Hidekazu Mimura, Yukie Nagai
Pages
610-611
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Shungo Azuma, Shunya Yokomae, Gota Yamaguchi, Hidekazu Mimura, Takashi ...
Pages
612-613
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Satoshi Matsuyama, Jumpei Yamada, Takato Inoue, Ami Nakamura, Kazuhiko ...
Pages
614
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Yuka Nishioka, Hiroyuki Yamaguchi, Satoshi Matsuyama, Junki Sonoyama, ...
Pages
615-616
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Nami Nakamura, Satoshi Matsuyama, Jumpei Yamada, Takato Inoue, Taito O ...
Pages
617
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Takato Inoue, Satoshi Matsuyama, Jumpei Yamada, Nami Nakamura, Taito O ...
Pages
618
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Yutaka Matsumoto, Satoru Egawa, Gota Yamaguchi, Syunya Yokomae, Hiroka ...
Pages
619-620
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Daiki Funaiwa, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
Pages
621
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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1st report: Development of Evanescent field Raman Spectroscopy System
Thang Do Van, Panart Khajornrungruang, Keisuke Suzuki
Pages
622-623
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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This paper reports development of an optical apparatus for Real-time observation during chemical reactions in Nano-scale process on surface such as CMP (Chemical-Mechanical polishing) and catalysis by applying in evanescent field. Beside using evanescent field to observe Nano-particles in physical aspects, the developed Raman spectroscopy apparatus aims to observe chemical aspects during reactions on processing surface. Changes in Raman scattering spectrum is expected to understand chemical reactions on the processing surface. In this report, the 532 nm wavelength laser source will be used to generate evanescent field. A rotation stage of diffraction grating and a translation stage will used to optimize the Raman spectrum data.
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Keisuke Akahoshi, Terutake Hayashi, Shuhei Kurokawa, Yoji Matsukawa, T ...
Pages
624-625
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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An algorithm for super-resolution and phase-retrieval
Hideaki Ozawa, Kanta Onoda, Shin Usuki, Tadatoshi Sekine, Kenjiro Miur ...
Pages
626-627
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Hiromasa Kume, Masaki Michihata, Kiyoshi Takamasu, Satoru Takahashi
Pages
628
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Yuki Shimizu, Shota Takazono, Yuri Kanda, Hiraku Matsukuma, Hajime Ina ...
Pages
629
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Calibration for the compressed pulse interval by using a reference interferometer
Tatsuya Kume, Hiromasa Yasuda, Tsutomu Mibe, Masaki Michihata, Kiyoshi ...
Pages
630-631
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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We aim to develop an alignment monitor which consists of multiple measurement paths of absolute distance interferometers which refer a pulse interval of an optical frequency comb compressed by an etalon as a length reference. Our previous studies suggested that the compressed pulse interval is determined by a free spectral range of the etalon and we had calibrated the pulse interval by referring a gauge block with uncertainty of 6 ppm (k = 2). Here, we calibrate it by using a reference interferometer calibrated with uncertainty of 1.7 ppm (k = 2) aiming for smaller uncertainty.
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Evaluation of temperature characteristics
Shusei Masuda, Tomohiko Takamura, Satoru Takahashi, Hirokazu Matsumoto ...
Pages
632-633
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Katsuhiro Miura, Atsuko Nose, Takao Tsukamoto
Pages
634-635
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Inner cercumference measurement of small complex parts,such as barrels for small-lenses dedicated for smartphones, has been in a great demand lately. To meet this demand,a new inner contour measuring method was developed. This new method tilts the optical axis of the point autofocus probe (PAP) to measure inner contour by applying the high tracking ability of PAP. The new measuring method has effective measuring inclination angles and measures cross section and circumference contours of a workpiece having its inner diameter less than several millimeters in sub-micron accuracy without repositioning by setting the optimal measuring conditions. In this paper,measurement accuracy and repeatability of inner contour measurement were verified by using an objective lens that is capable of measuring diameter having less than 7mm with its depth up to 7mm. It is useful for inner contour measurement of small lens ballels.
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Improving measurement accuracy when the cutting fluid is scattering medium
Kohei Matsumoto, Tsutomu Uenohara, Yasuhiro Mizutani, Yasuhiro Takaya
Pages
636-637
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Feature of AE Signal in Glass Grinding
Kouki Imai, Alan Hase
Pages
638-639
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Alan Hase
Pages
640-641
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Therdsak Jaingam, Chiaki Kaminaga, Takekazu Sawa, Masahiro Anzai
Pages
642-643
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Modern industrial materials have excellent properties. However, generally these materials are difficult-to-cut materials. In this Study, investigates the effect of the characteristics cutting conditions of various materials using TiAlN coated carbide radius end mill to tool wear and surface roughness. That is Titanium(Ti) and Titanium Alloy(Ti6Al4V) under high-speed milling condition. The cutting conditions are as follows, end mill diameter: 6 mm, corner radius: 0.5 mm, 4 blades, and depth of cut: 0.2 mm, pick feed: 0.1 mm, feed rate: 0.1, 0.15 mm/tooth, cutting speed 100-400 m/min and investigate 50-500 m of cutting length. The experimental tests were carried out in the dry cutting condition. In surface roughness, optimized cutting condition of titanium were at cutting speed 200 m/min, feed rate 0.15 mm/tooth and Ti6Al4V were at cutting speed 400 m/min, feed rate 0.1 mm/tooth. And in tool wear. Titanium wear is minimized at a 200 m/min cutting speed, feed rate 0.15 mm/tooth and Ti6Al4V is 100 m/min, feed rate 0.15 mm/tooth.
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Yohei Hashimoto
Pages
644-645
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Rion Yamaguchi, Wataru Sawada, Norikazu Suzuki, Eiji Syamoto, Yohei Ha ...
Pages
646-647
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Kazuki Mori, Atsunori Hiyama, Yohei Yamada, Junichi Ikeno
Pages
648-649
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Jianli Guo, Yusuke Matsuzawa, Hidekazu Mimura
Pages
650-651
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Jun Aiuchi, Yohei Yamada, Junichi Ikeno, Takeshi Abe, Toshimasa Mano
Pages
652-653
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Ryoichi Shiyama, Michio Uneda, Kyosuke Tenkou, Kazutoshi Hotta, Hitosh ...
Pages
654-655
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Naoki Kubo, Michio Uneda, Kazutoshi Hotta, Hitoshi Morinaga, Ken-ichi ...
Pages
656-657
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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1st Report : Experimental Evaluation by Developed Compact Apparatus
Thitipat Permpatdechakul, Panart Khajornrungruang, Keisuke Suzuki, Ara ...
Pages
658-659
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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The nanoscale polishing phenomena between the substrate surface and polishing pad during process, such as CMP process, were observed and evaluated, in this report. The concept of observation method is applied the generated evanescent field to limit the observable region only on the surface being polished, and the detectable scattering light from the nanoparticles and polishing pad when they move close to the surface in a range of evanescent field. The detected scattering light intensity could be used for evaluating the phenomena. According to the observed results, there should have been more than two different phenomena in polishing; the particles adhering on the polishing pad, and the individual movement particles during moving. However, the phenomena being able to perform polishing, could not clearly identify yet.
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2nd report : Non-contact Removal of Abrasive Nano-particles during Enforcing Mega sonic
Yutaka Terayama, Panart Khajornrungruang, Keisuke Suzuki, Thitipat Per ...
Pages
660-661
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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Ai Osaka, Daisetsu Toh, Kazuto Yamauchi, Yasuhisa Sano, Hidekazu Tanak ...
Pages
662-663
Published: March 01, 2020
Released on J-STAGE: September 03, 2020
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