We have previously succeeded in analyzing a clean adhesion interface by XPS utilizing a specific sample preparation of composite in which a filter paper was inserted between rubber and brass during the vulcanization. In this study, morphology of the interlayer was examined by SEM-EDX, in addition to the characterization of elemental distribution.
Cu
2S was found to be spherical at the interface for unaged specimens. Since Cu
2S tended to corrupt gradually by an emission of electron beam during the SEM analysis, Cu
2S was assumed to be amorphous.
From the specimen aged under a humid environment, morphology of the Cu
2S was found to be ragged crystalline. SEM image revealed that Cu
2S did not corrupt during the emission of electron beam, which suggests the change in morphology from soft amorphous to rigid crystalline during the aging under humid conditions. Crystallization of Cu
2S may lower the adhesion strength owing to decreased surface area and increased brittleness of the interfacial structure.
ZnO tended to grow at the interface in the specimen aged with hot water. ZnO was found to occur during the aging in hot water by dezincification with moisture along with the migration from rubber matrix.
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