Moiré effects caused by optical interference between regularly arrayed solid state image sensor pixels and test chart geometrical patterns were investigated.
Moiré patterns were found to occur as anchor patterns, hyperbolic patterns and circular patterns for a radial line chart, a hyperbolic zone plate chart and a circular zone plate chart, respectively. For a solid state image sensor with N
h horizontal pixels and N
v vertical pixels, the center of Moiré patterns is located along the vertical and horizontal axes at 3N
h/2r or 3r'N
h/2 TV lines for vertically arrayed pixels and at 2N
v/r or 2r'N
h TV lines for horizontally arrayed pixels, where integers r or r' were defined as Moiré's order numbers.
Moire pattern appearances were discussed in connection with the modulation transfer function determined by the effective photo-sensitive apertures of solid state image sensors.
View full abstract