[in Japanese]

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Efficient methods are proposed for elliptical patterns using the properties of conjugate diameters. They are the center detecting algorithm (CDA) and the form detecting argorithm (FDA). The (CAD) uses the property of an ellipse that two edge elements at the central symmetric have tangential lines in opposite directions. The (FDA) uses a property of conjugate diameters. The slope angle (θ) of the elliptical axis is computed using two pairs of conjugate diameter slopes. The semi-major diameter and semi-minor diameter can be computed using the coordinates of the ellipse line elements. These algorithms are used on to some sample images, and the performances of the two methods are compared. Elliptical patterns can be stably detected from complex line drawings, and can also be detected accurately from chipped patterns.

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Measurement technique has been developed using a 1-D CCD and a galvanometer mirror for scanning a laser spot to obtain an image of a 3-D object. The parts of the object to be scanned are determined by referring to data of previous scanning of the object. The number of points per line is also determined from data of previous scanning and then these points are distributed with different densities depending on the predicted shape of the object. To avoid the problems of conventional methods, we proposed a new method which combines two procedures : the redistribution of laser spot points and the addition or removal of the points. This method can be used to attain fast adapting for objects with complex shapes.

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