Journal of the Mass Spectrometry Society of Japan
Online ISSN : 1880-4225
Print ISSN : 1340-8097
ISSN-L : 1340-8097
Volume 18, Issue 3
Displaying 1-10 of 10 articles from this issue
  • AKIRA NAKAI
    1970 Volume 18 Issue 3 Pages 1063-1075
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    In order to study behaviour of ion beams precisely in a electromagnetic sector type mass analyzer, characteristics of the 3 rd order aberration of the aperture angle are discussed from the view-point of geometrical optics. It is proved that the position of the minimum image is affected mainly by the 3 rd order aberration, while the1st and the 2 nd have affects on the angle of tilt of the beam trajectory and the width of the minimum image, respectively. The effect of the 2 nd order aberration is compensated by that of the 3 rd and the resolving power may increase considerably, if the central beam enters into the uniform field with a small angle to the normal of the field boundary. The critical small angle should be determined from the coefficient of the 3 rd order aberration. This effect was verified by some experimental results.
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  • MASAHIKO SAKIMURA
    1970 Volume 18 Issue 3 Pages 1077-1095
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
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  • KOGORO MAEDA, AKIRA FUKUDA
    1970 Volume 18 Issue 3 Pages 1097-1148
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Tables of a, q and μ values are presented with an iso-μ-chart and also with detailed charts near, the apex parts for two types of the mass filter. The importance and usefulness of the μ value is mentioned in discussing the peak shape and the resolution, and for further studies of the mass filter problem.
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  • KAZUSHIGE NISHIZAWA, KAORU NARISADA, HIDENORI TERAMATSU, MUTSUAKI SHIN ...
    1970 Volume 18 Issue 3 Pages 1149-1154
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    The charge-spectrometer was constructed for the observation of the ionic fragments and the charge distribution following nuclear transformation. The optimum condition to collect and accelerate the ions in the source volume was confirmed for the 85 Kr of β- ·decay.Then, the correction factors for charge 1, 2, ……were determined and it was known that the correction factor depended pro portionally on the charge of ion.
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  • HIROHIKO EZOE, TAKASHI SHIKATA, KAZUYOSHI TAKAHASHI, TAKATOMO IZUME
    1970 Volume 18 Issue 3 Pages 1155-1160
    Published: September 01, 1970
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
    A stabilized d. c. current supply of wide scanning range for an electro-magnet of a mass spectrometer has been constructed. The circuit is composed of two parts: One is the degenerative stabilizer to keep the output current stabilized, and the other works to control the output voltage of the rectified power supply to prevent over-voltage on the stabilizer during the scanning. The short-time and and long-time stabilities of the output currents are5·10-6-5·10-5 and 3·10-5-5·10-5, respectively, in the scanning range from 0.05 to 0.85 amperes. The ripple content of 50 and 100 Hz are estimated to be in the order of 0.001%.
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  • HIROHIKO EZOE, AKIO KOYAMA, ISAO NISHI
    1970 Volume 18 Issue 3 Pages 1161-1167
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    A simple and compact electron multiplier being composed of two parallel resistance strips and works only with an oblique electrostatic field applied between them is constructed, and the experimental results and discussions on the characteristics of the device are presented. The device would be usefulunless the primary current varies over a wide range to ensure its linearity.
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  • Measurements of secondary electron emission coefficient and ion self-reflection coefficient of the solid surface bombarded with accelerated ions. —An approach to the effect of radiogenic recoil
    MICHI ARATANI
    1970 Volume 18 Issue 3 Pages 1169-1176
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    Measurements were made of emission of secondary electrons and self-reflection of ions from the targets bombarded with 10-25kV accelerated ion beams available in a mass separator. Maximum energies of the secondary electrons were measured in the ion bombardments of Sb+ on Sb, Sb+on Al, Mg+on Mg, and Mg+on Al surfaces. Secondary electron emission coefficients byion bombardment γi and ion self-reflection coefficients(SEEC and ISRC, respectively in the present work)were also obtained with Sb+ and Mg+ beams on various surfaces. These basic data led us to the discussion of the mechanism of secondary electron emission from the surface by ion bombardment in the energy range much higher than H. D. Hagstrum had examined, and further to the discussion of the effects of heavy ions translating and stopping in solid, irrespective of their origins.
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  • H. INOUYE, S. KITA, T. SASAKI
    1970 Volume 18 Issue 3 Pages 1177-1188
    Published: September 01, 1970
    Released on J-STAGE: March 01, 2011
    JOURNAL FREE ACCESS
    Description is given about the structure and characteristics of an apparatus recently constructed for scattering experiments of ion beams, in the energy range of 500-4000 eV, in collision with room temperature gas molecules. Attenuation method with this apparatus gives a total cross section of elastic scattering through effective laboratory angles greater than 5× 10-3 rad. The repulsive potential determined by the experiment on K+ -Ar system is well represented by V(r)=1780 exp(-3.46r)eV for1.79<r<2.43(A)in good agreement with the result obtained by Amdur, et al.
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  • NORIAKI SASAKI, KENJI KUBO, MITSURU ASANO
    1970 Volume 18 Issue 3 Pages 1189-1194
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    The specially designed ion source of mass spectrometer has been used to measure simultaneously both ions formed by electron impact and by self surface ionization, and from these measurements the work functions and the heats of sublimation of atoms and positive ions of rhenium, tantalum and tungsten have been determined. These values obtained are 5.62±0.08, 7.94±0.20and10.19±0.28eV for rhenium, 5.02±0.11, 8.04±0.12and10.90±0.23eV for tantalum, and 5.04±0.29, 9.28±0.27 and 12.22±0.56eV for tungsten, respectively.
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  • H. SAKAI, O. MATSUBAYA, Y. NAKAJIMA
    1970 Volume 18 Issue 3 Pages 1195-1204
    Published: September 01, 1970
    Released on J-STAGE: June 28, 2010
    JOURNAL FREE ACCESS
    A mass spectrometer of the McKinney type was constructed for the precision routine isotopic analysis of oxygen, carbon and sulfur. The machine is basically a modification of the Hitachi model RMU-6 E mass spectrometer and equipped with dual sample inlet and dual ion beam collection and balancing systems(Fig. 1).A small output signal of the No.2 amplifier of the balancing system is recorded digitally as well as by a pen recorder. A set of measurement of a given sample is auto matically carried out after mannual adjustments of the sample and standard gas pressure and selection of the potential divider positions. Instrumental error of a set of measurement is±0.05‰for a reutine analysis.The reproducibility ofδ18O measurement is much worse than the quoted instrumental error when δ18O values of a gas sample are compared(Table4). However, the differences between two gas samples can be measured satisfactorilv within±0.05‰. Factors affecting the precision and reproducibility are discussed on the basis of the isotopic data so far obtained. Some results of the interlaboratory comparison of the instrument are also descirbed.
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