Proceedings of JSPE Semestrial Meeting
2005 JSPE Autumn Meeting
Displaying 201-250 of 638 articles from this issue
  • Tatsuaki Furumoto, Takashi Ueda, Tomoya Arashi, Nariyoshi Sugihara, Ma ...
    Session ID: E67
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    In dental treatment with Nd:YAG laser, the laser beam which ordinarily comes out from the optical fiber is effective to eliminate the enamel and the dentin. A diffused and circumferential laser beam, which is produced by using a processed optical fiber at the tip, is effective for the treatment of soft tissue. In the present study, processing characteristics at the tip of the optical fiber is investigated, when TiO2 powder with average grain size of 1mm is used. An experimental instrument is developed to measure the power and the energy distribution of the straight beam radiated from the processed optical fiber. Furthermore, on the cavity made in the enamel by the straight beam, the volume and maximum depth are measured by a 3D surface profiling system and the surface is observed by SEM.
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  • Noritaka Kawasegi, Noboru Morita, Shigeru Yamada, Noboru Takano, Tatsu ...
    Session ID: E68
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    This study proposes a novel process of nano–scale patterning method on a metallic glass surface using focused ion beam (FIB) irradiation, followed by wet chemical etching. We found that etch rate of a metallic glass surface irradiated by FIB can be drastically changed, and rapid patterning is possible utilizing this method. Dependences of etch rate of irradiated area on various conditions are investigated. As a result, concave structures can be fabricated at the high dose conditions. The result of the depth dependence on etch time reveals that the affected layer is formed on the interior of the substrate. These results indicate a possibility of these results to novel nano–patterning method of metallic glass.
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  • Takaaki Nakao, Jun Taniguchi, Yasuo Kogo, Iwao Miyamoto, Noritaka Kawa ...
    Session ID: E69
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    It is possible to etch only to the part where the ion beam was irradiated selectively by irradiating the focused ion beam to quartz, and developing it with the buffered hydrogen fluoride afterwards. The etching speed in this case is about two digits earlier than the etching speed by the FIB processing. And, it has been understood to be able to process the nano order. Then, this technique was used, the mask was not used, and the line and the space pattern were made.
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  • Hirofumi Hidai, Hitoshi Tokura
    Session ID: E73
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    We describe the fabrication of carbon microstructures by laser induced chemical vapor deposition. In this research, ethylene was used as a source gas. Carbon was deposited by argon ion laser irradiation. Plate shaped microstructure fabrication was tried with scanning laser beam irradiation on substrates: SUS304 and absorbent painted glass. As a result, column shaped microstructure was deposited on the SUS304 in spite of scanning laser beam. The mechanism of the column shaped structure deposition was investigated. Laser irradiation with changing irradiation conditions revealed that the difference of the thermal conductivity of the substrates effects for the shape of the deposits. Plates shaped microstructure was fabricated on glass substrate.
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  • Yuki Uzawa, Kunimitsu Takahashi, Toshio Kasai, Tomoyuki Yoneyama, Yosh ...
    Session ID: E74
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Sphere shaped carbon particles consist of carbon fiber which has a diameter of 20nm to 2000nm, it is called nano–fiber ball (NFB), was synthesized by laser chemical vapor deposition. An Ar ion laser with the wavelength of 514nm was focused on a Ni coated glass plate in a chamber filled with hydrocarbon and sulfur–contained–gas. Those gases were thermally decomposed in the vicinity of laser irradiation spot. Maintaining a laser irradiation formed a NFB at high growth rate. SEM observations of irradiation spot indicated catalytic growth. We discuss about the growth mechanism of NFBs and dependence of catalysis thickness on NFBs growth.
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  • Takashi Hosono, Hirofumi Hidai, Hitoshi Tokura
    Session ID: E75
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Laser enhanced wet etching of single crystalline silicon has been investigated. In this report, KOH and NH4HF2 has been tested as etchant to discuss possibility of chemical drilling of silicon enhanced by laser beam transmitted through optical fibers. As a result of CW Nd:YAG laser irradiation in KOH, the entire silicon surface including the area out of the laser spot was corroded. H2O2 was accordingly added to the solution to realize local selective drilling. Suitable concentration of KOH depends on H2O2 concentration, laser power and dopant type. The fact suggests that composition optimization will make the etchant applicable to drilling with optical fibers. In case of NH4HF2 laser enhanced etching, the etch rate matched with the rate of KOH and H2O2. However, ideas of protecting silica optical fiber from NH4HF2 should be necessary for achievement of drilling with fibers because high laser power which must damage plastic optical fiber is required for enough etch rate.
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  • Takayuki Shimizu, Toshiyuki Miyazaki, Tadashi Misu, Yoshihiro Tanaka
    Session ID: E76
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Color marking in Ti is carried out by YAG laser in the atmosphere. Relations between processing conditions such as the irradiation power, beam diameter, scanning speed and coloring characteristics are obtained. In addition, the marking area is analyzed by AUGER and XPS.
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  • Yoshihiro Kataoka, Tatsuya Yoshinaka, Toshiyuki Miyazaki
    Session ID: E77
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    CO2 laser beam was applied to the cladding of nickel alloy on alloy tool steel by a preplaced powder method. The hardness and microstructure of the clad layer were investigated by changing the power of laser, number of clad layers. The average hardness of the clad layer was 240˜260 HV0.1 under the following conditions:laser power of 2200 W to 3100 W, cladding speed of 400 mm/min, defocusing distance of 30 mm, oscillation width of 7 mm and argon gas shielding. The microstructure of clad layer showed a fine dendeites of which secondary dendrite arm apacing was 5 μm because of their rapid solidification. A heat affected zone was produced near the clad layer on the surface of the alloy tool steel and their martensitic structure was observed.
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  • Masato Yoshioka, Hirofumi Hidai, Hitoshi Tokura
    Session ID: E79
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    We describe modification of various glasses by a CW Laser Backside Irradiation (LBI) method. In this method, an absorbent which was attached on one side of a glass sheet, was irradiated from the other side through the glass with CW laser beam. The characteristics of modified zone were examined by etching in 8 wt.% HF solution. As a result, it turned out that modified zone consisted of two layers and etching rate of the inner part was lower than that of the outer part. The Raman spectroscopy revealed that the density of the inner part increased by the modification.
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  • Takeshi Monodane, Etuji Ohmura, Humistugu Hukuyo, Kensi Hukumitu, Hide ...
    Session ID: E80
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    When a pulsed Nd:YAG laser is focused into a single crystal silicon and a locally melted region is solidified, internal cracks are developed from the polycrystalline layer to the single crystal layer. This processing is used for dicing of silicon wafer, which is called ″Stealth Dicing″ and attracts attention. In this paper, we conducted thermal–elastoplasticity analysis by Finite Element Method (FEM) in order to evaluate the processing phenomena, and calculated the stress intensity factor of Mode I type for various crack lengths. It was found that the stress intensity factor exceeds the fracture toughness when a crack length is almost the same to the width in the longitudinal section of the polycrystalline layer. Therefore, a possibility of crack propagation was suggested.
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  • Retsu Tahara, Yoshikazu Yoshida, Nobuyuki Terada, Jun Yamada, Hiroyuki ...
    Session ID: E81
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    The micro–fluidic devices for blood test are developed. A number of heat–hardening resin–films were piled up on a soda glass. A laser fabricated apart of the channel at each film on every lalmination. The microchannel with then 3–D honeycomb structure and groove structure was fabricated. The artificial capillary vessel sizes have φ13µm and depths of 90µm. In this research processing conditions for artificial capillary vessel were examined. Blood was injected into them. The relation between erythrocyte deformability and the structures of vessel was observed.
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  • Nobuyuki Kasai, Toshiyuki Miyazaki, Tsuyoshi Tokunaga, Tadashi Misu, K ...
    Session ID: E82
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Heating by laser beam and electric discharge energy is applied to material removal process. A tip of electrode is set above a metal target and electric field is applied. The electric discharge is caused by the plasma generation depending on laser heating. In the present experiments, fundamental characteristics of melting and removal in this process are discussed.
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  • Akihiro Hosoya, Takaya Yoshikawa, Motohiro Nakano, Yoshiaki Yamauchi, ...
    Session ID: E83
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    We investigated the light emission from high density plasma produced by pulse laser, which is essential to extreme–ultraviolet (EUV) source for the next generation lithography. We measured EUV intensity and visible light emission from the plasma generated by focused laser to targets of three metals (Sn, Al, Cu) and two target shapes (flat, cone), using a photo diode senser with Si/Zr filter and a high–speed framing camera. The EUV emission from Sn target was highest. The duration of visible light emission from the cone shaped target was longer than that for flat target. These results suggest that the cone shaped Sn target is promising for the high power EUV light source application.
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  • Tamotsu Kume, Tricard Marc, Dumas Paul, Forbs Greg, Kordonski William
    Session ID: F01
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    This paper summarizes some of QED Technologies′ latest developments in the field of high–precision polishing and metrology. Magneto–Rheological Finishing (MRF) is a deterministic sub–aperture polishing process. MRF has demonstrated the ability to produce optical surfaces with accuracies better than 30 nm peak–to–valley (PV) and surface micro–roughness less than 0.5 nm rms on a wide variety of optical glasses, single crystals, and glass–ceramics. The MR fluid forms a polishing tool that is perfectly conformal and therefore can polish a variety of shapes, including flats, spheres, aspheres. QED′s Sub–aperture Stitching Interferometer (SSI) complements MRF by extending the effective aperture, accuracy, resolution, and dynamic range of a phase–shifting interferometer. This workstation performs automated sub–aperture stitching measurements of spheres, flats, and mild aspheres. Aside from the correction of sub–aperture placement errors, our software also accounts for reference–wave error, distortion, and other aberrations. By addressing these matters up front, we avoid limitations encountered in earlier stitching work and significantly boost reproducibility beyond that of the integrated interferometer on its own.
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  • kazutoshi Adachi, Katsumi Yamaguchi, Sakuro Honda, Kazuo Murata, Hidek ...
    Session ID: F03
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Atmospheric compensator to reduce the laser measurement error caused by change in the refractive index of air has been produced and applied to the ultra–precision machine tool, and the position measurement error of the machine tool is actually reduced. In this study, the initial length which corresponds to deadpath length in optical path of the laser interferometer is treated to improve the performance of the compensator. The influence of the difference between the set value of initial length and the true one on measurement error is evaluated. The positioning accuracy of the machine tool has been improved by introducing the optimal value of initial length estimated by experimental results to the compensator.
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  • Jiwang Yan, Tooru Asami, Nobuhito Yoshihara, Tsunemoto Kuriyagawa
    Session ID: F04
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Laser micro–Raman spectroscopy was used to examine the silicon substrates plunge–cut by a round–nosed diamond tool under various conditions, and the results were compared with those of continuous diamond turning tests described in a previous paper. The results showed that the subsurface layer was partially transformed to amorphous, the extent of amorphization depending strongly on the depth of cut and tool rake angle. The Raman intensity ratio of the amorphous phase to the crystalline phase reaches maximum within the ductile–brittle transition region; while as the depth of cut increases or decreases from the ductile–brittle transition region, the intensity ratio decreases. It was also indicated that although a higher negative tool rake angle can achieve a larger critical depth of cut, it may cause more significant amorphization and subsurface damage than a lower negative rake angle.
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  • Masahiro Yuuki, Hirofumi Suzuki, Yutaka Yamagata, Toshiro Higuchi, Hit ...
    Session ID: F06
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    None axis–symmetric aspherical surfaces are required for recent advanced digital devices, such as DVD/CD lenses, fθ lenses and rear projector mirrors in. This paper deals with ultra precision fly cutting of none axis–symmetric aspherical surfaces by single crystal diamond tool. The tool trace in fly cutting of none axis–symmetric aspherical surfaces was introduced and the fly cutting system of 3–axes (X,Z,C) control was developed. In this cutting experiment, electronless Ni was fly–cut and the surface roughness in different radial position was measured. From the experiments, the feed rate control method was useful.
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  • Seigo Umakoshi, Hirofumi Suzuki, Yuji Yamamoto, Tadashi Okino, Yoshio ...
    Session ID: F07
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    This report deals with high precision and high efficiency truing of poly–crystalline daimond tools by use of molybdenumalloy.Tungsten carbide can be cut ultra precisely with poly–crystalline diamond micro milling tool,which is installed onto a high speed tool spindle with collet chuck.In this case,the micro milling tool should be trued on the machine.
    The poly–crystalline diamond tool has been usually ground with diamond wheel or electric discharge machining.But the traing preciseness with conventional methods was not so high and the truing of poly–crystalline diamond tools by molybdenum alloy is proposed and basic reserch was carried out with comparisons of GC,stainless steel.
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  • Takeshi Kimura, Hirohumi Suzuki, Yuji Yamamoto, Tadashi Okino, Yoshio ...
    Session ID: F08
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    The moulding dies are usually made of electroless nickel to be cut precisely with single crystal diamond tool. Recently, hard materials such as hardened steels or WC have to be cut for more moulding times. In this study, a new micro milling tool of PCD was developed and basic cutting characteristics were researched in milling of WC. And a feasibility study of a precision aspherical cutting was carried out. From the experimental results, mirror surface of 6.5 nmRz and form accuracy of 0.09μmP–V were obtained. It is clarified that precision cutting of WC dies can be done with the developed PCD milling tool.
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  • Keisuke Echigo
    Session ID: F09
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    This paper presents a new aspheric generator and high–precision measuring and compensation method for next–generation DVD lens mold. It reports on composition of new aspheric generator, on the on–machine measuring system. It is confirmed that the small radius lens mold for next generation DVD is machined by using this machine and on–machine measuring system with 40 nm accuracy.
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  • Tetsuya Taguchi, Akiko Aoki, Yoshihiro Hokari, Daisuke Saito, Ryohei T ...
    Session ID: F31
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    The quality of gears is classified according to deviations by ISO 1328, and recently a system to evaluate gear measuring instruments is to be established. The purpose of our research is to develope a highly accurate gear measuring instrument with small uncertainty of measured values and a repeatability less than 1 micro meter.
    To reduce the transmission errors caused by the mechanisms in conventional gear measuring instruments, a gear measuring instrument consisting of two direct drive axes, linear axis and rotary axis, is proposed and being developed by authors.
    The basic concept and configuration of the measuring instrument are described in this paper.
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  • Akiko Aoki, Sawa Fuke, Tetsuya Taguchi, Ryohei Takeda, Aigou Ming, Mak ...
    Session ID: F32
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    The purpose of our research is to develope a highly accurate gear measuring instrument with small uncertainty of measured values and a repeatability less than 1 micro meter.
    And a gear measuring instrument consisting of direct drive linear axis and rotary axis is being developed by authors.
    In this paper, the experimental results of motion control of each axis and synchronous driving of two axes to simulate profile measurement are given.
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  • Fumi Takeoka, Masaharu Komori, Aizo Kubo, Yuji Kariya, Takehiro Ito, K ...
    Session ID: F33
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    The form of machine part with axis, e.g. gear, has much influence on its performance, therefore strict quality control of machine part with axis is demanded. Atomic force probe measuring machine can achieve more accurate measurement than current coordinate measuring machine. But appropriate measuring method is needed to apply it to the measurement of machine parts, especially machine parts with axis, because their form error must be evaluated in reference to the position of the axis. In this report, precise measuring method of machine parts with axis by an atomic force probe measuring machine is proposed. In addition, influence of error factors of this measurement is investigated.
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  • Toshinobu Sanuki, Makoto Tano, Wei Gao, Satoshi Kiyono
    Session ID: F34
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    This paper desribes a PZT–based fast–tool–control (FTC) system for ultra–precision diamond turning. A pre–loaded ring–type PZT with a maximum stroke of 70 mm is employed to actuate the diamond tool attached on the free end of the PZT. The displacement of the PZT is servo controlled by a PID controller based on the measurement result of a capacitance–type displacement sensor integrated inside the PZT actuator. A piezoelectric–type force sensor is coaxially connected on the other end of the PZT for detection of machining force. Investigation of static and dynamic responses of the FTC, calibration of the force sensor output are carried out.
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  • Tohru Ohnishi, Shotoku Takase, Kiyoshi Takamasu
    Session ID: F36
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    A method realizing high accuracy even in the measurement scene for coordinate measuring technology have been investigated. In this report, we clarify the factor of the probing error that was observed in the measurement scene.
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  • Shotoku Takase, Tohru Ohnishi, Kiyoshi Takamasu
    Session ID: F37
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Making sure of relationship between probing points and uncertainty, multi measurement strategies are used. It is one of the techniques for evaluation of the uncertainty of measurement. Workpiece having bad form error, say 40μm, is measured. On circle measurements, probing points are varied from 5 to 12. Error from strategy varies from 8 to1μm. This variation of error derived from the number of probing point is compared to the simulation, and they come to an agreement
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  • Kenichiro Fujino, Yuki Kinebuchi, Hiroaki Iwai, Kimiyuki Mitsui, Akira ...
    Session ID: F38
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    In order to achieve the further improvements to speed and accuracy of NC machine tools, a variety of devices for measuring the motion accuracy have been developed. But the existing methods, for example DBB method (Double Ball Bar method) etc., are the measuring method for only circular motion and difficult to measure along arbitrary tool path in a three dimensional space. We developed the measuring method using links and rotary encoders and have improved it. And this time, we aimed the expansion of measuring range applying the counter weight. The repeatability of the measurements has also been investigated.
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  • Shinji Sato, Wei Gao, Satoshi Kiyono
    Session ID: F39
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Precision rotary/linear dual–axis positioning systems with nanometric resolution, high–speed and wide moving stroke are also desired in various areas of nanotechnology, such as nano–manipulation of cells, micro–parts, etc. This paper presents prototype rotary/linear dual–axis positioning system in which a rotor (moving body) can be moved along and rotated about the axis (Z) of a ceramic cylinder (driving rod). The stroke of the prototype system along Z–axis, which is limited by the length of the cylinder, is designed to be 10 mm and there is no limitation in the rotary motion. Experimental results indicate that the maximum speeds in the two directions are approximately 2.4mm/sec and 50rpm, respectively.
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  • Masato Aketagawa, Hiroshi Honda, Masashi Ishige, Chaikool Patamaporn
    Session ID: F43
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    We have made a regular crystalline ruler using a regular crystalline surface and a scanning tunneling microscope. In the autumn meeting of JSPE 2004, we proposed 2–dimensional encoder method by combining multi–probe scanning tunneling microscopes and regular crystalline surface. In the report, we show the experimental verification of 2–dimensional encoder using the prototype equipment and the dither vibration method.
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  • Yosuke Ikeda, Nuttapong Tanyarat, Masato Aketagawa
    Session ID: F44
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    We have developed a length measurement method by combining a phase modulation homodyne interferometer, whose resolution is picometer or less when the optical path difference equals wavelength x integer, and regular crystalline surface, whose lattice spacing can be observed with a scanning tunneling microscope (STM). In the method, optical fringe of the ineterferometer and the lattice spacing derived from STM observation, are utilized as coarse and fine scales, respectively. We made the prototype equipment and demonstrate its performance to evaluate nonlinear interpolation error of a optical linear encoder, whose resolution is less than subnanometer.
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  • Xin Chen, Kiyoshi Takamasu, Toshihiro Ishida
    Session ID: F45
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    Planar linear motor is a precision positioning stage, which is different from the usual XY stage and consisted of multiple linear motors arranged orthogonally in the same layer. It is a general way to employ a laser interferometer as the positional sensor of the plane linear motor. Therefore, it is necessary to use an external interferometer and orthogonal gauge in higher accuracy for accuracy evaluation and calibration. In this paper, mixed 2–point method is proposed to let user perform calibration easily and relative high accuracy and the primary measurement result of reflecting mirror profile is reported.
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  • Makoto Tano, Wei Gao, Satoshi Kiyono
    Session ID: F46
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    This paper describes a surface encoder, which consists of a sensor unit and a sinusoidal grid, for precision positioning of a sawyer motor–driven stage over a long stroke. The 2D local slopes of two points on the grid surface are simultaneously detected by the two angle sensors of the sensor unit. The positions and directions of movement in the X– and Y–directions can thus be detected by the two–phase sensor outputs with a phase difference of 90 degrees in each direction. To generate quadrature encoder outputs, the collimated light from the laser diode of the sensor unit is passed through an aperture plate on which two apertures are generated in such a way that the two beams output from the apertures are exactly projected onto the desired positions on the grid surface.
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  • Sin ichirou Yanaka, Masayuki Nara, Kiyoshi Hino, Yoshihisa Tanimura
    Session ID: F47
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    An laser interferometer has been developed in order to measure straightness by use of the three surface method. The purpose of this development was reducing uncertainty of straightness measurement. This paper presents an test result of this inrerferometer.By use of this interferometer and the three surface method, we measeured shapes of three 400 mm steel straight edges. The measurment was repeated 20 times. As a result, standard deviations of measured shapes were less than 10 nm (k=1) in all samples.
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  • Ryusuke Nakajima, Takashi Miyoshi, Yasuhiro Takaya
    Session ID: F61
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    We proposed a novel SOI wafer inspection technique for nano–defects in the layers of SOI wafer surface, not by using scattered light but evanescent light based on near–field optics. In this method, we treat the air on wafer and SOI layer and BOX layer as the 3 layers dielectric slab waveguide for IR laser light that generates IR evanescent wave onto the near field region over wafer surface. By using probe to scan the evanescent light that is easily disturbed by nano–defects existing on the wafer surface or in the layers, this method makes it possible to sensitively detect the nano–defects, even if they exist in the thin layers. In this paper, first the near–field of the wafer surface vicinity is analyzed by using FDTD (Finite Difference Time Domain) simulation tool. These simulation results showed this method can detect and classify the nano–meter scale defects on the surface and in the layers of SOI wafers sensitively. Next the several fundamental experiments for SOI wafer with the layer thickness of 160nm were carried out to verify the results of this computer simulation.
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  • Tatsuo Hariyama, Yasuhiro Takaya, Takashi Miyoshi
    Session ID: F62
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    In our reseach, an optically trapped silica particle is used as a measuring probe particle. The probe particle is trapped at a beam waist of the focused laser light and is forced to vibrate by deflecting the beam waist using AOD. The vibrating probe particle has a resonance frequency because it is governed by the spring–mass–damper system. When an aerosol particle is attached to the probe particle, the resonance frequency shifts according to the increase of the total mass. The mass of the aerosol particle can be measured from the shift of the resonance frequency.
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  • Hiroaki Nishioka, Satoru Takahashi, Kiyoshi Takamasu
    Session ID: F63
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    A super–resolution microscopy technique with standing evanescent light in TIR (Total Internal Reflection) has been proposed that resolves samples on the interface in a lateral resolution of better than the diffraction limit. Samples are illuminated with standing evanescent light shifted in different positions, and the sample distribution is calculated from acquired scattering images in the use of ART (Algebraic Reconstruction Technique). This technique improves the lateral resolution up to about 1/7 of the diffraction limit.
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  • Toshiyuki Nakao, Shin Usuki, Satoru Takahashi, Kiyoshi Takamasu
    Session ID: F64
    Published: September 15, 2005
    Released on J-STAGE: April 18, 2006
    CONFERENCE PROCEEDINGS FREE ACCESS
    The introduction of nano–voids into low–k dielectric layers is very effective in reducing the dielectric constant, but the killer–pore is a crucial defect on further integrations and miniaturizations, which remains a problem that does not seem to have a solution. Destructive analytical techniques such as the scanning transmission electron microscopy are mainly used for the inspection of low–k dielectric layers, but non–destructive inspection is required. We proposed non–destructive inspecting method of the nano–void in the low–k dielectric layers based on the near field optics. We tried electromagnetic simulations, and demonstrated the effectiveness of the proposal technique.
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