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Tomoyuki Toda, Tomoki Yamasaki, Yasunari Miyamoto, Yohei Murakami
Session ID: D61
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Analysis of translational diffusion coefficient based on a photon correlation method
Terutake Hayashi, Toshiki Seri, Syuhei Kurokawa, Yoji Matsukawa
Session ID: D62
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
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Masato Sumiya, Mitsutoshi Nakagawa
Session ID: D63
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
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Micro porous membrane filters have been applied to CMP slurry filtration for reducing micro scratches. But short service life by fouling is major issues. This study investigated relationship of large particle count (LPC), abrasive particle concentration with filter service life and found that optimum pre-filtration had significant effect on longer service life by reducing LPC and that combination of lower LPC and lower abrasive particle concentration had further significant effect.
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Relationship between slurry flow behavior in slurry film thickness and surface texture of polishing pad
Yuichi Tomiie, Michio Uneda, Kazutoshi Hotta, Kazusei Tamai, Hitoshi M ...
Session ID: D64
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
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This study investigates the slurry flow behavior in the contact surface between the substrate and the polishing pad in chemical mechanical polishing (CMP) of hard-to-process materials. In the evaluation of slurry flow behavior, the digital image correlation method was used. In this paper, we tried to estimate the slurry flow behavior in the slurry film thickness direction by using the phenomenon that the light transition ratio is affected by the slurry film thickness. Furthermore, we discussed the reliability of estimated slurry film thickness compared with the polishing pad surface texture. As a result, we can estimate the slurry flow velocity at the neighborhood of the substrate surface during the CMP, and the removal rate increase with the increase of the slurry flow velocity ratio.
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Hajime Okumura
Session ID: D66
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
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Yuta Nakahira, Ai Isohashi, Van Pho Bui, Tatsuaki Inada, Daisetsu Toh, ...
Session ID: D68
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Hitoshi Hosokawa, Shinnosuke Kobune, Yohei Yamada, Junichi Ikeno
Session ID: D69
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Shingo Oshika, Norikazu Suzuki, Yohei Hashimoto, Eiji Shamoto
Session ID: D73
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Kosuke Hayakawa, Michio Uneda, Kazutaka Shibuya, Yoshio Nakamura, Daiz ...
Session ID: D74
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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The removal rate in CMP is affected by the polishing pad surface asperity. The relationship between the surface asperity and the removal rate is only discussed in the single-sided polisher. Moreover, it is well known that the contact image analysis device which uses the image rotation prism is effective for evaluating the surface asperity. However, the conventional device cannot evaluate the upper platen of the double-sided polisher (DSP). On the other hand, the DSP is frequently used for fabricating the high planarized substrate. This study demonstrates the characteristics of newly produced prototype device for measuring polishing pad surface asperity pasted upper platen of the DSP. This prototype device has a mechanism which can apply the measuring load to the image rotation prism by the spring load. In this paper, we tried the effectiveness evaluation on newly device from the viewpoint of the comparing the conventional device. As a result, it is founded that newly device has enough performance for measuring the surface asperity pasted the upper platen in the DSP.
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Hirotaka Misono, Norikazu Suzuki, Shingo Oshika, Eiji Shamoto
Session ID: D75
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Terutake Hayashi, Keigo Matsunaga, Syuhei Kurokawa, Hideaki Yokoo, You ...
Session ID: D77
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Takuya Hommyo, Yoshihiro Kaneko, Yohei Yamada, Junichi Ikeno
Session ID: D78
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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processing of the silicon carbide substrate
Toshinobu Miyazaki, Reiji Ryokume, Yasuhisa Sano, Satoshi Matsuyama, K ...
Session ID: D79
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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There is generally a need for high efficiency flattening processing method of a next generation of semiconductor substrate such as SiC, GaN and diamond in order to commercialize these materials. Plasma Chemical Vaporization Machining (PCVM) method at atmospheric pressure is well known as the high efficiency processing, but this processing method does not have the effect of flattening. In such circumstances, we devised new flattening processing method by adsorbing F radicals to a flat plate of a reference plane and transporting F radicals to the surface of sample. In this report, we report on the processing results of SiC substrates by the new flattening processing method.
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Hydrogenated carbon film and the substrate bias of the quality of the relationship
Koji Akashi, Shun Wakai, Shinsuke Matsui, Shigeru Umemura
Session ID: E01
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Effects of Applied Potential on Localized Material Removal Rate
Kota Yamamoto, Yurino Furukawa, Junji Sasano, Moeto Nagai, Takayuki Sh ...
Session ID: E02
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Tatsuya Tokuyama, Hiroki Teshima, Hiroshi Kawakami, Yoshihiro Sato
Session ID: E03
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Takeshi Nakano, Minoru Ota, Kai Egashira, Keishi Yamaguchi, Kouki Maed ...
Session ID: E04
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Tsuneo Kurita, Syunya Hongo, Kazuyuki Mizuhara, Kiwamu Ashida
Session ID: E06
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Kosuke Kawahara, Hiroshi Sawada
Session ID: E07
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Yuuta Konno, Makoto Yamaguchi, Noritaka Kawasegi, Tomomi Koudu, Noboru ...
Session ID: E08
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Noriyuki Sato, Sadao Momota, Daisuke Tominaga, Koutaro Mokuo, Takuya S ...
Session ID: E09
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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SiC crystal was irradiated by Ar beam at 90 and 700 kV with the fluence range from 1×10 to the power of 15 up to 2×10 to the power of 17 [ion/cm2] and the induced swelling height was measured. Irradiation effect and the range distribution were calculated by TRIM to evaluate the optimization of the experimental condition. As a result of experiment, a swelling structure was successfully processed on the SiC crystal surface. The swelling height could be controlled from 1nm up to 100nm with a precision of about 5nm.
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Development of apparatus for micro structured surface fabrication to evaluate function
Yuki Suzuki, Yuki Matsumoto, Masaki Michihata, Kiyoshi Takamasu, Sator ...
Session ID: E13
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Akihiro Mori, Ryuu Sannomiya, Hayato Kobayashi, Masayuki Hasegawa, Kaz ...
Session ID: E14
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Ryuta Suzuki, Souta Matsusaka, Hirofumi Hidai, Akira Chiba, Noboru Mor ...
Session ID: E15
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Unkai Sato, Hideki Kawakubo
Session ID: E16
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Naoyuki Sato, Jun Taniguchi
Session ID: E31
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Noa Kobayashi, Toshiyuki Horiuchi
Session ID: E32
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Yuta Takano, Jun Taniguchi
Session ID: E33
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Hiroshi Takahashi, Tomoya Sagara, Toshiyuki Horiuchi
Session ID: E34
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Development of Au-Pd-Pt catalyst
Ryo Shirai, Masanori Hayase
Session ID: E36
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Hisahiro Wadayama, Jun Taniguchi
Session ID: E37
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Hiroki Takemoto, Hiroaki Kakiuchi, Kiyoshi Yasutake, Hiromasa Ohmi
Session ID: E38
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Hikari Eto, Shin Hiwasa, Jun Taniguchi
Session ID: E39
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Shuhei Yasuda, Satoshi Matsuyama, Hiromi Okada, Yasuhisa Sano, Yoshiki ...
Session ID: E61
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Jumpei Yamada, Satoshi Matsuyama, Kazuto Yamauchi
Session ID: E62
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Spatio-temporal overlapping of split X-ray pulses at SACLA
Takashi Hirano, Taito Osaka, Yasuhisa Sano, Yuichiro Inubushi, Satoshi ...
Session ID: E63
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Design of exposure system
Hiroto Ogimoto, Hidekazu Mimura
Session ID: E64
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Hirokatsu Yumoto, Takahisa Koyama, Haruhiko Ohashi
Session ID: E66
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Yuki Kobayashi, Yuiki Goto, Katsuyoshi Endo, Dai Yamazaki, Ryuji Yamaz ...
Session ID: E67
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Yuiki Goto, Yuki Kobayashi, Katsuyoshi Endo, Dai Yamazaki, Ryuji Maruy ...
Session ID: E68
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Shogo Sakaiya, Daisuke Funato, Katsuyoshi Endo, Kazuya Yamamura
Session ID: E69
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Yoshinori Takei, Yuusuke Matsuzawa, Hidekazu Mimura
Session ID: E73
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Gota Yamaguchi, Takehiro Kume, Hidekazu Mimura
Session ID: E74
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Proposal of the method using a nitrogen
Akihisa Kubota, Hiroyuki Yokoi, Mutsumi Touge
Session ID: E75
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Proposal of the method using an ozone
Akihisa Kubota, Hiroyuki Yokoi, Mutsumi Touge
Session ID: E76
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Takahiro Higashi, Hidekazu Mimura
Session ID: E77
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Shinsuke Matsui
Session ID: F02
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Kazuhiro Araki, Sunao Murakami, Takahiro Ito
Session ID: F04
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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Hitoshi Funatsu, Ohmi Fuchiwaki, Noriyuki Mori, Kenichiro Imai, Yoshim ...
Session ID: F05
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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We report that experimental evaluation of wet-coil based pick and place method for 100 micro meter sized silicon cuboid. In experiments, we get 70% success rate for picking up and 100% placing down to commercially available double-stick tape. We also discuss about future works.
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Mikio Horie, Issei Unezawa
Session ID: F07
Published: August 20, 2016
Released on J-STAGE: February 20, 2017
CONFERENCE PROCEEDINGS
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In this research, in order to realize the functions equivalent to the functions of the spherical bearing which is frequently used in conventional spatial mechanisms, a polymeric manufactured hinge with Hytrel®(DU PONT-TORAY), which has excellent flexural fatigue resistance, have been proposed. Next, the shape and dimensions of the polymeric manufactured hinge having low stress values at bending deformation have been found by FEM analysis results. In addition, a polymer-made three-degrees-of-freedom(3DOF) spatial parallel manipulator which consists of this polymer-made hinge is designed and developed, and the output displacement characteristics of the manipulator are revealed.
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