The Journal of Reliability Engineering Association of Japan

Volume 35, Issue 8

Displaying 51-82 of 82 articles from this issue

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7.6 Micro-Wave/Millimeter-Wave All Si CMOS Multiband Receiver Front-End IC(7. Responsiveness,<Special Survey>Dependable VLSI System)

Masatoshi NAKAYAMA, Toshiyuki TANAKA, Ryuji INAGAKI, Masaomi TSURU, Ei ...

Article type: Article
2013Volume 35Issue 8 Pages 485-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_485

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 486-487
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_486

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 488-489
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_488

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8.1 The Role of Security LSI and Examples of Malicious Attacks(8. Security,<Special Survey>Dependable VLSI System)

Takeshi FUJINO, Daisuke SUZUKI

Article type: Article
2013Volume 35Issue 8 Pages 491-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_491

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8.2 Methods for Tampering Cryptographic LSIs(8. Security,<Special Survey>Dependable VLSI System)

Yohei HORI, Daisuke SUZUKI, Masayoshi YOSHIMURA, Masaya YOSHIKAWA, Tak ...

Article type: Article
2013Volume 35Issue 8 Pages 492-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_492

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8.3 Tamper-Resistant Symmetric-Key Cryptography Circuits(8. Security,<Special Survey>Dependable VLSI System)

Mitsuru SHIOZAKI, Takeshi FUJINO, Masaya YOSHIKAWA

Article type: Article
2013Volume 35Issue 8 Pages 493-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_493

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8.4 Verification Method for Tamper Resistance in VLSI Design(8. Security,<Special Survey>Dependable VLSI System)

Masaya YOSHIKAWA, Daisuke SUZUKI, Yohei HORI, Takeshi FUJINO

Article type: Article
2013Volume 35Issue 8 Pages 494-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_494

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8.5 Physical Unclonable Functions : Memory PUF(8. Security,<Special Survey>Dependable VLSI System)

Hidehiro FUJIWARA, Makoto YABUUCHI, Koji NII

Article type: Article
2013Volume 35Issue 8 Pages 495-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_495

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8.6 Evaluation Method for Countermeasures against Scan-Based Attacks(8. Security,<Special Survey>Dependable VLSI System)

Masayoshi Yoshimura

Article type: Article
2013Volume 35Issue 8 Pages 496-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_496

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8.7 Tamper-Resistance Evaluation Technique(8. Security,<Special Survey>Dependable VLSI System)

Yohei HORI

Article type: Article
2013Volume 35Issue 8 Pages 497-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_497

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 498-499
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_498

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 500-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_500

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9.1 Verification and Test Coverage(9. Test Coverage,<Special Survey>Dependable VLSI System)

Koichiro Takayama

Article type: Article
2013Volume 35Issue 8 Pages 501-502
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_501

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9.2 FLEC : A Formal Verification Tool(9. Test Coverage,<Special Survey>Dependable VLSI System)

Masahiro FUJITA, Takeshi MATSUMOTO, Kazutoshi WAKABAYASHI

Article type: Article
2013Volume 35Issue 8 Pages 503-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_503

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9.3 High Quality Delay Test for VLSI Field Test(9. Test Coverage,<Special Survey>Dependable VLSI System)

Michiko INOUE, Tomokazu YONEDA

Article type: Article
2013Volume 35Issue 8 Pages 504-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_504

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9.4 Temperature-and-Voltage-Variation-Aware Test(9. Test Coverage,<Special Survey>Dependable VLSI System)

Tomokazu YONEDA, Yuta YAMATO

Article type: Article
2013Volume 35Issue 8 Pages 505-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_505

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 506-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_506

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 507-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_507

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10.1 Trends in Fault Causes and Challenges for the Future(10. Future and / or Un-Identified Problems,<Special Survey>Dependable VLSI System)

Nobuyasu KANEKAWA

Article type: Article
2013Volume 35Issue 8 Pages 509-510
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_509

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10.2 Dependability Requirements for the Data Center(10. Future and / or Un-Identified Problems,<Special Survey>Dependable VLSI System)

Takashi MIYOSHI

Article type: Article
2013Volume 35Issue 8 Pages 511-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_511

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10.3 Patchable Hardware and Rectification Methods for Post-Silicon Validation(10. Future and / or Un-Identified Problems,<Special Survey>Dependable VLSI System)

Masahiro FUJITA, Hiroaki YOSHIDA, Satoshi JO, Takeshi MATSUMOTO

Article type: Article
2013Volume 35Issue 8 Pages 512-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_512

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10.4 Logging and Using Field Test Data for Improved Dependability(10. Future and / or Un-Identified Problems,<Special Survey>Dependable VLSI System)

Seiji KAJIHARA, Satoshi OHTAKE

Article type: Article
2013Volume 35Issue 8 Pages 513-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_513

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10.5 Fault Detection and Reconfiguration Method for Multiple CPU Cores(10. Future and / or Un-Identified Problems,<Special Survey>Dependable VLSI System)

Masashi IMAI, Tomohiro YONEDA

Article type: Article
2013Volume 35Issue 8 Pages 514-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_514

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10.6 Checkpoint-Restart for Heterogeneous Computing Systems(10. Future and / or Un-Identified Problems,<Special Survey>Dependable VLSI System)

Hiroyuki TAKIZAWA, Masayuki SATO, Ryusuke EGAWA, Hiroaki KOBAYASHI

Article type: Article
2013Volume 35Issue 8 Pages 515-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_515

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10.7 Co-Designing SoC and SiP for Noise Immunity and High Reliability(10. Future and / or Un-Identified Problems,<Special Survey>Dependable VLSI System)

Nobuyuki YAMASAKI, Kikuo WADA

Article type: Article
2013Volume 35Issue 8 Pages 516-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_516

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 517-518
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_517

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 519-520
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_519

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Article type: Appendix
2013Volume 35Issue 8 Pages 521-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_521

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 522-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_522_1

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 522-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_522_2

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[title in Japanese]

Article type: Appendix
2013Volume 35Issue 8 Pages 522-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_522_3

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[title in Japanese]

Article type: Cover
2013Volume 35Issue 8 Pages Cover2-
Published: December 01, 2013
Released on J-STAGE: January 31, 2018

DOIhttps://doi.org/10.11348/reajshinrai.35.8_Cover2

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