In this paper, we explain the principles of holography to the main problems and solutions to facilitate the introduction of holographic particle measurement into the powder production process. Using the Jetson Orin Nano (NVIDIA), one of the single-board computers with GPU (Graphics Processing Unit), we develop a module that streamlines the optical system for seamless integration into the process. We are also clarifying the issues that need to be addressed in the module design. Finally, we describe the characteristics of the reconstructed particles measured by real-time holographic particle measurement using the module.

Particle dispersion configuration in LiCoO₂-CB-NMP/PVDF cathode slurry of lithium-ion battery (LIB cathode slurry) has been cross-sectionally visualized by Electrical Equivalent Circuit- Electrical Impedance Tomography (EEC-EIT). EEC-EIT reconstructs two types of conductivity images regarding LiCoO₂ particle interface Δσ^PI and NMP-PVDF solution Δσ^SO from the resistance elements R^PI and R^SO calculated by EEC model, which is modeled based on the configuration of LIB cathode slurry. We experimentally evaluated EEC-EIT under LIB cathode slurry mixing in a beaker with eight electrodes at mixing speed of ω = 200 rpm or 700 rpm. As the results, Δσ^PI and Δσ^SO were increased as the mixing time t elapses, which indicates that CB particles penetrated between LiCoO₂ particles and that formation of CB-PVDF aggregates occurred, respectively. Moreover, the two types of images are quantitativity compared with scanning electron microscope (SEM) images.

We will introduce examples of mass inspection equipment using stress measurement, and contaminants and shape inspection equipment using magnetic field and X-ray measurement used in pharmaceutical manufacturing lines, as well as their principles and trends in high-precision measurement technology, including the application of AI technology.

It was introduced a test example in which a jet mill line was automatically controlled using an online particle size analyzer, and also introduced sampling example from multiple process lines. In a jet mill line, an online particle size analyzer was installed at the mill outlet, and the raw material feed rate was feedback-controlled based on the measured particle size. The particle size of the mill product could be controlled with a delay of about 2 minutes. An example of sampling from two lines revealed that it is possible to perform sampling that responds instantaneously to line switching without contamination.