IEEJ Transactions on Sensors and Micromachines
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
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Volume 128, Issue 8
Displaying 1-4 of 4 articles from this issue
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Special Issue on “Nanomaterial Process Technology for Ubiquitous Society”
Special Issue Paper
  • Structural Analysis of C60 Nanotubes Heat-Treated in Vacuum
    Kun'ichi Miyazawa, Cherry Ringor, Kohei Nakamura, Masaru Tachibana, Ka ...
    2008 Volume 128 Issue 8 Pages 317-320
    Published: August 01, 2008
    Released on J-STAGE: August 01, 2008
    DOIhttps://doi.org/10.1541/ieejsmas.128.317
    JOURNAL FREE ACCESS
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    The structural change of C60 nanotubes (C60NTs) by heating in vacuum was investigated using thermo-gravimetric analysis (TGA), transmission electron microscopy (TEM) and Raman spectroscopy. The C60NTs were prepared by use of a pyridine solution saturated with C60 and isopropyl alcohol (IPA). A weight loss of about 4 % in the C60NTs dried at room temperature was observed by heating up to 400°C in a N2 atmosphere, and the C60NTs started to decompose from about 600°C. The Ag(2) peak of as-prepared C60NTs shows a Raman shift indicating one-dimensionally polymerized C60, while the C60NTs heated at 100°C ∼ 500°C in vacuum show Ag(2) peaks characteristic of van der Waals C60 crystals, suggesting a change of bonding state of C60 molecules by heat treatment. TEM observations show that the crystallinity and surface morphology of C60NTs are degraded by high-temperature heat treatment in vacuum.
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  • Bending Deformation of C60 Nanowhiskers in Solution and Air
    Mami Watanabe, Kun'ichi Miyazawa, Kenichi Kojima, Masaru Tachibana
    2008 Volume 128 Issue 8 Pages 321-324
    Published: August 01, 2008
    Released on J-STAGE: August 01, 2008
    DOIhttps://doi.org/10.1541/ieejsmas.128.321
    JOURNAL FREE ACCESS
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    The mechanical properties of C60 nanowhiskers (C60NWs) grown in a solution by a liquid-liquid interfatical precipitation method were investigated by a bending method. C60NWs in the solution exhibited large elastic deformation where they recovered for large bending with a curvature of 290 μm. On the other hand, C60NWs in air were broken even for small bending with only a 650 μm curvature. From the analysis of the bending, the yield stress or breaking stress for C60NWs in air is estimated to be 7.7 MPa, that is larger by one order compared with 0.7 MPa for bulk C60 crystals. In addition, it is shown that the Young's modulus for C60NWs in the solution is 8.9 GPa, that is below a half of 20 GPa for bulk C60 crystals.
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  • The Dependence of Demolding Characteristics on Side Wall Roughness of Mold in Thermal Imprint
    Hiroaki Kawata, Junya Ishihara, Masayo Kayama, Masaaki Yasuda, Yoshihi ...
    2008 Volume 128 Issue 8 Pages 325-330
    Published: August 01, 2008
    Released on J-STAGE: August 01, 2008
    DOIhttps://doi.org/10.1541/ieejsmas.128.325
    JOURNAL FREE ACCESS
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    Various Si molds with different side wall roughness were fabricated and the demolding forces for the thermal imprint to PMMA film were examined. The pattern size was the 2 μm half pitch line and space with the aspect ratio of about 2. The demolding force greatly depended on the side wall roughness of the mold. The demolding force normalized by the total side wall area of line patterns was 0.34 MPa for the smooth side wall mold.
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