電気学会論文誌E(センサ・マイクロマシン部門誌)
Online ISSN : 1347-5525
Print ISSN : 1341-8939
ISSN-L : 1341-8939
134 巻, 6 号
選択された号の論文の13件中1~13を表示しています
特集:第30回「センサ・マイクロマシンと応用システム」シンポジウム受賞論文特集
巻頭言
特集論文
特集研究開発レター
  • Yong-Jun Seo, Masaya Toda, Yusuke Kawai, Takahito Ono
    2014 年 134 巻 6 号 p. 166-167
    発行日: 2014年
    公開日: 2014/06/01
    ジャーナル フリー
    Silicon nanowires have attracted considerable attention due to their excellent mechanical and electrical properties and widely investigated for various applications. One of the exciting applications is magnetic resonance force microscopy (MRFM), which requires a high sensitive probe for three-dimensional imaging of spin densities. In this study, we have fabricated a 160 nm-wide and 52 µm-long Si nanowire probe with a Si mirror and Ni magnet from a silicon-on-insulator wafer. The nanowire is suitable structure as the probe for a detection of MRFM. The probe shows a resonance frequency of 8.007 kHz and a Q factor of approximately 5000. Two-dimensional force mapping based on electron spin resonance has been demonstrated using the fabricated nanowire probe.
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