分光研究

金属表面薄膜の反射赤外スペクトル

末高治

1969 年 18 巻 4 号 p. 187-193
発行日: 1969/09/30
公開日: 2011/02/23

DOIhttps://doi.org/10.5111/bunkou.18.187

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赤外溶媒シフトと分子間相互作用

大井尚文

1969 年 18 巻 4 号 p. 194-201
発行日: 1969/09/30
公開日: 2010/06/28

DOIhttps://doi.org/10.5111/bunkou.18.194

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カントレコーダによる高合金鋼の定量分析

13%Mn鋼, 18%Mn-5%Cr鋼

前川静弥, 鈴木孝範, 森永博

1969 年 18 巻 4 号 p. 202-209
発行日: 1969/09/30
公開日: 2010/06/28

DOIhttps://doi.org/10.5111/bunkou.18.202

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In order to raise the efficiency of analytical works for a high alloy steel (13% Mn steel, 18% Mn-5% Cr steel) by means of a quantorecorder, a study of quantitative analysis was made for samples obtained from molten steel in the smelting furnace, and samples from final products.The results obtained are summarized as follows:
(1) Cr 2677.16A line is affected by Mn 2677.24A or 2676.74A line and Si 2516.12A line is affected by Mn 2516.73A line in the case of oscillatory low voltage spark, and, therefore, some correction should be made.
(2) Analytical results obtained by the present method was satisfactory for samples in the steel-smelting process.For pit samples and samples from products, however, conventional chemical analysis should be employed.

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X線励起ルミネッセンス法による希土類元素の分析

(第1報) 測定装置および酸化ランタン中の希土類元素の定量

中島篤之助, 河口広司, 高島教一郎, 大内義彦

1969 年 18 巻 4 号 p. 210-217
発行日: 1969/09/30
公開日: 2011/02/23

DOIhttps://doi.org/10.5111/bunkou.18.210

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A rapid, quantitative analytical technique for the analysis of rare earth impurities is described.The method, X-ray excited optical fluorescence, uses high-energy X-rays to excite the rare earth impu-rities in appropriate matrices.The excited rare earth impurities fluorescence with simple line emission spectra which can be used for quantitative measurements.
The experimental equipment employed is similar to that described by Linares et al. and also Sasaki.In the present study the X-ray source is a Machlett OEG-60 tungsten-target X-ray tube driven by a ARL power supply.A sample chamber is shown in Fig.2.The fluorescent radiation is made monochromatic by a Hitachi Perkin-Elmer Model 139 scanning spectrophotometer equipped with a 1440 lines/mm grating blazed at 2000Å, and detected with an photomuitiplier (HAMAMATSU TV Co., Ltd.R106) having S-19 response, and a fused silica-envelope.An amplifier equipped in the spectrophoto-meter and a chart recorder (TOA Electronics Ltd., EPR-2T) complete the system.
Pr, Nd, Sm, Eu, Gd, Tb, Dy, Ho, Er and Tm have been determined by this method with detection limits ranging from 0.2 ppm to 20 ppm in La₂O₃.
Appreciable amounts of Pr, exceeding 500 ppm in some cases was found in commercial La₂O₃, which had been used as the raw material for optical glass.
Spectrum patterns obtained for each rare earth element in La₂O₃ are also presented.The detection limits in other oxide systems are surveyed and discussed.

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