IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
E102.C 巻, 4 号
選択された号の論文の18件中1~18を表示しています
Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology
  • Hideto Hidaka
    2019 年 E102.C 巻 4 号 p. 243-244
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル フリー
  • Masahiko YOSHIMOTO, Shintaro IZUMI
    原稿種別: INVITED PAPER
    2019 年 E102.C 巻 4 号 p. 245-259
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル フリー

    This paper surveys advances in biomedical processor SoC technology for healthcare application and reviews state-of-the-art architecture and circuits used in SoC integration. Particularly, this paper categorizes and describes techniques for improving power efficiency in communication, computation, and sensing. Additionally, it surveys accuracy enhancement techniques for bio-signal measurement and recognition. Finally, we have discussed the potential new directions for development as well as research.

  • Toshinori SATO, Tongxin YANG, Tomoaki UKEZONO
    原稿種別: PAPER
    2019 年 E102.C 巻 4 号 p. 260-268
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル 認証あり

    Approximate computing is a promising paradigm to realize fast, small, and low power characteristics, which are essential for modern applications, such as Internet of Things (IoT) devices. This paper proposes the Carry-Predicting Adder (CPredA), an approximate adder that is scalable relative to accuracy and power consumption. The proposed CPredA improves the accuracy of a previously studied adder by performing carry prediction. Detailed simulations reveal that, compared to the existing approximate adder, accuracy is improved by approximately 50% with comparable energy efficiency. Two application-level evaluations demonstrate that the proposed approximate adder is sufficiently accurate for practical use.

  • Yuya NISHIO, Atsuki KOBAYASHI, Kiichi NIITSU
    原稿種別: PAPER
    2019 年 E102.C 巻 4 号 p. 269-275
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル フリー

    This study proposes a design and calibration method for a small-footprint, low-frequency, and low-power gate leakage timer using a differential leakage technique for IoT applications. The proposed gate leakage timer is different from conventional ones because it is composed of two leakage sources and exploits differential leakage current for the charging capacitor. This solution alleviates the inherent trade-off between small-footprint and low-frequency in the conventional gate leakage timer. Furthermore, a calibration method to suppress variations of the output frequency is proposed in this paper. To verify the effectiveness of the proposed gate leakage timer, a test chip was fabricated using 55-nm-DDC-CMOS technology. The test chip successfully demonstrates the highest figure of merit (FoM) of the product of the capacitor area (0.072µm2) and output frequency (0.11Hz), which corresponds to an improvement by a factor of 2,121 compared to the conventional one. It also demonstrates the operation with 4.5pW power consumption. The total footprint can be reduced to be 28µm2, which enables low-cost and low-power IoT edges. The scaling scenario shows that the proposed technique is conducive to technology scaling.

  • Haosheng ZHANG, Aravind THARAYIL NARAYANAN, Hans HERDIAN, Bangan LIU, ...
    原稿種別: PAPER
    2019 年 E102.C 巻 4 号 p. 276-286
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル 認証あり

    This paper presents a high power efficient pulse VCO with tail-filter for the chip-scale atomic clock (CSAC) application. The stringent power and clock stability specifications of next-generation CSAC demand a VCO with ultra-low power consumption and low phase noise. The proposed VCO architecture aims for the high power efficiency, while further reducing the phase noise using tail filtering technique. The VCO has been implemented in a standard 45nm SOI technology for validation. At an oscillation frequency of 5.0GHz, the proposed VCO achieves a phase noise of -120dBc/Hz at 1MHz offset, while consuming 1.35mW. This translates into an FoM of -191dBc/Hz.

  • Masanori HAYASHIKOSHI, Hiroaki TANIZAKI, Yasumitsu MURAI, Takaharu TSU ...
    原稿種別: PAPER
    2019 年 E102.C 巻 4 号 p. 287-295
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル 認証あり

    A 1-Transistor 4-Magnetic Tunnel Junction (1T-4MTJ) memory cell has been proposed for field type of Magnetic Random Access Memory (MRAM). Proposed 1T-4MTJ memory cell array is achieved 44% higher density than that of conventional 1T-1MTJ thanks to the common access transistor structure in a 4-bit memory cell. A self-reference sensing scheme which can read out with write-back in four clock cycles has been also proposed. Furthermore, we add to estimate with considering sense amplifier variation and show 1T-4MTJ cell configuration is the best solution in IoT applications. A 1-Mbit MRAM test chip is designed and fabricated successfully using 130-nm CMOS process. By applying 1T-4MTJ high density cell and partially embedded wordline driver peripheral into the cell array, the 1-Mbit macro size is 4.04 mm2 which is 35.7% smaller than the conventional one. Measured data shows that the read access is 55 ns at 1.5 V typical supply voltage and 25C. Combining with conventional high-speed 1T-1MTJ caches and proposed high-density 1T-4MTJ user memories is an effective on-chip hierarchical non-volatile memory solution, being implemented for low-power MCUs and SoCs of IoT applications.

  • Wang LIAO, Masanori HASHIMOTO
    原稿種別: PAPER
    2019 年 E102.C 巻 4 号 p. 296-302
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル 認証あり

    Soft error jeopardizes the reliability of semiconductor devices, especially those working at low voltage. In recent years, silicon-on-thin-box (SOTB), which is a FD-SOI device, is drawing attention since it is suitable for ultra-low-voltage operation. This work evaluates the contributions of SRAM, FF and combinational circuit to chip-level soft error rate (SER) based on irradiation test results. For this evaluation, this work performed neutron irradiation test for characterizing single event transient (SET) rate of SOTB and bulk circuits at 0.5 V. Using the SBU and MCU data in SRAMs from previous work, we calculated the MBU rate with/without error correcting code (ECC) and with 1/2/4-col MUX interleaving. Combining FF error rates reported in literature, we estimated chip-level SER and each contribution to chip-level SER for embedded and high-performance processors. For both the processors, without ECC, 95% errors occur at SRAM in both SOTB and bulk chips at 0.5 V and 1.0 V, and the overall chip-level SERs of the assumed SOTB chip at 0.5 V is at least 10 x lower than that of bulk chip. On the other hand, when ECC is applied to SRAM in the SOTB chip, SEUs occurring at FFs are dominant in the high-performance processor while MBUs at SRAMs are not negligible in the bulk embedded chips.

Special Section on Progress in Optical Device Technology for Increasing Data Transmission Capacity
Regular Section
  • Peng LI, Zhongyuan ZHOU, Mingjie SHENG, Qi ZHOU, Peng HU
    原稿種別: PAPER
    専門分野: Electromagnetic Theory
    2019 年 E102.C 巻 4 号 p. 371-379
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル 認証あり

    This paper presents a method combining array signal processing and adaptive noise cancellation to suppress unwanted ambient interferences in in situ measurement of radiated emissions of equipment. First, the signals received by the antenna array are processed to form a main data channel and an auxiliary data channel. The main channel contains the radiated emissions of the equipment under test and the attenuated ambient interferences. The auxiliary channel only contains the attenuated ambient interferences. Then, the adaptive noise cancellation technique is used to suppress the ambient interferences based on the correlation of the interferences in the main and auxiliary channels. The proposed method overcomes the problem that the ambient interferences in the two channels of the virtual chamber method are not correlated, and realizes the suppression of multi-source ambient noises in the use of fewer array elements. The results of simulation and experiment show that the proposed method can effectively extract radiated emissions of the equipment under test in complex electromagnetic environment. Finally, discussions on the effect of the beam width of the main channel and the generalization of the proposed method to three dimensionally distributed signals are addressed.

  • Daisuke OKAMOTO, Hirohito YAMADA
    原稿種別: PAPER
    専門分野: Optoelectronics
    2019 年 E102.C 巻 4 号 p. 380-387
    発行日: 2019/04/01
    公開日: 2019/04/01
    ジャーナル 認証あり

    To address the bandwidth bottleneck that exists between LSI chips, we have proposed a novel, high-sensitivity receiver circuit for differential optical transmission on a silicon optical interposer. Both anodes and cathodes of the differential photodiodes (PDs) were designed to be connected to a transimpedance amplifier (TIA) through coupling capacitors. Reverse bias voltage was applied to each of the differential PDs through load resistance. The proposed receiver circuit achieved double the current signal amplitude of conventional differential receiver circuits. The frequency response of the receiver circuit was analyzed using its equivalent circuit, wherein the temperature dependence of the PD was implemented. The optimal load resistances of the PDs were determined to be 5kΩ by considering the tradeoff between the frequency response and bias voltage drop. A small dark current of the PD was important to reduce the voltage drop, but the bandwidth degradation was negligible if the dark current at room temperature was below 1µA. The proposed circuit achieved 3-dB bandwidths of 18.9 GHz at 25°C and 13.7 GHz at 85°C. Clear eye openings in the TIA output waveforms for 25-Gbps 27-1 pseudorandom binary sequence signals were obtained at both temperatures.

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