IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
E96.C 巻, 3 号
選択された号の論文の24件中1~24を表示しています
Special Section on SQUID & its Applications
Special Section on Recent Progress in Molecular and Organic Devices
Regular Section
  • Zhengliang LV, Shiyuan YANG, Hong WANG, Linda MILOR
    原稿種別: PAPER
    専門分野: Semiconductor Materials and Devices
    2013 年 E96.C 巻 3 号 p. 393-401
    発行日: 2013/03/01
    公開日: 2013/03/01
    ジャーナル 認証あり
    Process variation causes significant fluctuations in the timing performance of analog circuits, which causes a fraction of circuits to fail specifications. By testing the delay-performance, we can recognize the failed circuits during production testing. In this paper, we have proposed a low overhead and process tolerant delay evaluation circuit for built-in self test (BIST) function for analog differential circuits. This circuit contains a delay generation cell, an input differential signal generation cell, a delay matching cell, a sample-hold circuit, and a comparator. This circuit was implemented with 0.18µm CMOS process. Simulation results over process variation, devices mismatch and layout parasitics, but without silicon measurement, show that the accuracy in delay detection is within 5ps. A case study was done over a feed-forward equalizer (FFE). A typical use of this circuit is testing the delay of various FIR (Finite Impulse Response) filters.
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