IEICE Transactions on Electronics
Online ISSN : 1745-1353
Print ISSN : 0916-8524
E91.C 巻, 8 号
選択された号の論文の33件中1~33を表示しています
Special Section on Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2007)
  • Shigeru UMEMURA
    2008 年E91.C 巻8 号 p. 1177
    発行日: 2008/08/01
    公開日: 2018/07/01
    ジャーナル 認証あり
  • Roland S. TIMSIT
    原稿種別: INVITED PAPER
    専門分野: INVITED
    2008 年E91.C 巻8 号 p. 1178-1191
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    At high signal frequencies (i. e. in the GHz range), a connector must be considered as part of an electromagnetic transmission line. At these frequencies, the impedance characteristics of the connector stemming from the distributed inductance and capacitance of pins and the associated wiring, must be carefully controlled; insertion losses must be minimized and undesirable coupling between non-neighboring pins giving rise to crosstalk must be avoided to achieve optimal signal transmission. This paper reviews fundamental issues associated with the performance optimization of multi-conductor connector structures for high speed signal transmission. The paper complements an earlier publication that reviewed the major factors affecting electrical contact resistance at high frequencies [1].
  • Terutaka TAMAI, Yasushi SAITOH, Yasuhiro HATTORI, Hirosaka IKEDA
    原稿種別: PAPER
    専門分野: Contact Phenomena
    2008 年E91.C 巻8 号 p. 1192-1198
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    Characteristics of conductive elastomer that is composed of silicone rubber and dispersed carbon black particles show conductive and elastic properties in one simple material. This material has been widely applied to make-break contacts of panel switches and connectors of liquid crystal panels. However, since surface state of the contact is very soft, it is difficult to remove contaminant films of contaminated opposite side contact surface and to obtain low contact resistance owing to break the film. This is an important problem to be solved not only for the application of make-break switching contact but also static connector contacts. This study has been conducted to examine some complex structures of the elastomer which indicate removal characteristics for contaminant films and low contact resistance. As specimens, six different types of elastomer contacts composed of different type of dispersed materials as carbon and metal fibers, metal mesh, and plated surfaces were used. The contacts of opposite side were Au and Sn plated contact surface on a printed circuit board (PCB) which is usually used in the static connector and make-break contacts. In order to contaminate contact surfaces of PCB, the surfaces were subjected to exposure in an SO2 gas environment. The elastomeric contacts contained hard materials showed lower contact resistance than only dispersed carbon particles in the elastomer matrix for both contaminated PCB contact surfaces.
  • Tetsuya ITO, Shigeru SAWADA, Yasuhiro HATTORI, Yasushi SAITOH, Terutak ...
    原稿種別: PAPER
    専門分野: Contact Phenomena
    2008 年E91.C 巻8 号 p. 1199-1205
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.
  • Noboru WAKATSUKI, Hiroshi HONMA
    原稿種別: PAPER
    専門分野: Contact Phenomena
    2008 年E91.C 巻8 号 p. 1206-1210
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    VI time responses of a conventional electromagnetic relay during breaking contact operations were measured. In a conventional switching circuit, unstable contact resistance, irregular bouncing, and poor reproducibility were confirmed. Using a transient current switch circuit and two sharpened contact electrodes, bouncing during a breaking operation was suppressed, and unstable contact resistance changes and reproducibility of breaking operation were also improved.
  • Yoshitada WATANABE, Yuichi HIRAKAWA
    原稿種別: PAPER
    専門分野: Contact Phenomena
    2008 年E91.C 巻8 号 p. 1211-1214
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    This paper reports on the effect of switching action on the contact surfaces of earthquake disaster prevention relays. Large-scale earthquakes occur frequently in Japan and bring extensive damage with them, and fire caused by electrical equipments is one example of the serious damage which can occur. Earthquake sensors capable of maintaining a high level of reliability when earthquakes occur play an important role as a means of minimizing this damage. For this reason, we carried out observations by focusing on samples which had either been subjected to an electric current of 10mA or 0.1A. The samples of 10mA exhibited low and constant contact resistance despite the addition of seismic motion, while the samples of 0.1A samples exhibited varying contact resistance and damage on their contact spots resulting from the addition of seismic motion. The sample surfaces were then observed using an atomic force microscope (AFM) in tapping mode and a surface potential microscope (SPoM). As a result, we found that even the unused earthquake disaster prevention relay (standard sample) which had a surface lined with asperities on its parallel striations formed by irregular protrusions due to dust and other deposits. In addition, scanning the contact surface with the SPoM at the same potential revealed the occurrence of differences in surface potential which varied in response to the asperities on the striations.
  • Guofu ZHAI, Wenying YANG, Xue ZHOU
    原稿種別: PAPER
    専門分野: Contact Phenomena
    2008 年E91.C 巻8 号 p. 1215-1221
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    Research on the electromagnetic compatibility of functional module composed of two independent electromagnetic relays in a hermetically sealed shell is the technical foundation for integration and miniaturization of electronic equipment in the future. In this paper, 3D finite element method (FEM) was used to analyze the dynamic characteristics of twin-type relay interfered by uniform constant magnetic field and identify the sensitive direction in which the relay was easily interfered. The models of twin-type relay in three working states were founded. Through simulation and analysis, it was found out how the operation time and electromagnetic torque of twin-type relay changed with the outer interfered magnetic field. When the relay was on the point of operation failure, the critical value of magnetic field was calculated through simulation. The simulation results of the dynamic characteristics of twin-type relay agree well with the experimental data. The conclusion in this paper is of great value for research on the electromagnetic compatibility of relay functional module.
  • Yi WU, Mingzhe RONG, Jian LI, Xiaohua WANG
    原稿種別: PAPER
    専門分野: Contact Phenomena
    2008 年E91.C 巻8 号 p. 1222-1227
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    In this paper we mainly focus on the effect of a ferromagnetic material on the critical current of Bi-2223 tape. The magnetic field distributions of tapes with several different layouts of a ferromagnetic material are investigated by calculation and the corresponding critical current is tested experimentally. The analysis indicates that the critical current of the tape can be improved effectively by laying the ferromagnetic material perpendicularly next to the tape edge. Furthermore, various other ferromagnetic parameters are also important for reducing the magnetic field induced by the current flowing through the tape.
  • Xingwen LI, Degui CHEN
    原稿種別: LETTER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1228-1229
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    The precision of magnetic field calculation is crucial to predict the arc behavior using magnetohydrodynamic (MHD) model. A integrated calculation method is proposed to couple the calculation of magnetic field and fluid dynamics based on the commercial software ANSYS and FLUENT, which especially benefits to take into account the existence of the ferromagnetic parts. An example concerning air arc is presented using the method.
  • Yoshiki KAYANO, Hikaru MIURA, Kazuaki MIYANAGA, Hiroshi INOUE
    原稿種別: LETTER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1230-1232
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    Arc discharge generated by breaking electrical contact is considered as a main source of an undesired electromagnetic (EM) noise. To clarify mechanism of generation of the EM noise, feature extraction of bridge and short-time arc waveforms generated by slowly breaking Ag contact was discussed experimentally. The short-duration time arc before the ignition of the continuous metallic arc discharge was observed. The highest probability density voltage is defined as short-arc sustainable voltage (SASV). The relationship between SASV and duration of short-time arc was quantified experimentally. It is revealed that as the arc voltage of the short-time arc is higher, its duration becomes longer.
  • Guofu ZHAI, Xue ZHOU
    原稿種別: PAPER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1233-1239
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    An electrical arc is generated by opening the contacts of a relay when the current is above the minimum arc current in a circuit. A magneto-hydrodynamic (MHD) model was employed to simulate this dynamic arcing process. The distributions of arc parameters such as temperature, electrical field and magnetic flux density generated by opening the contacts in a circuit with a 5 A DC low current were obtained. The behaviors of the arc parameters with increasing gap length between the contacts were also simulated. The MHD model was then combined with structured dynamic layering, which is a dynamic meshing technique of computational fluid dynamics (CFD) to calculate the dynamic arcing process, and the arc parameters generated by opening the contacts in the circuit with a 5 A DC low current with a constant velocity were also obtained. It turned out that the computed time-varying contact voltage and arc duration agreed well with the test results. Thus, the validity of the simulation was demonstrated.
  • Qiang MA, Mingzhe RONG, Anthony B. MURPHY, Yi WU, Tiejun XU, Fei YANG
    原稿種別: PAPER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1240-1248
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    This paper focuses on the numerical and experimental investigations of the influence of two polymers (PA6 and POM) on the arc behavior during arc motion process. The mathematical model of 3-dimentional air arc plasma considering the ablation of lateral walls is built based on magnetic hydro-dynamics (MHD). By adopting the commercial computational fluid dynamics (CFD) package based on control-volume method, the above MHD model is solved and the distribution of temperature field, concentration field, flow field and electrical potential field in the arc chamber are calculated. The simulation results indicate that the vapor concentration behind the arc column is higher than that in front of the arc column because of the existence of “double vortices” in the arc chamber. The use of polymers causes the maximal arc voltage increase 16.2% with POM and 18.9% with PA6 in this case and causes the average arc velocity increase 15.8% with POM and 21.1% with PA6 in this case. The experiments are also carried out to study the influence of polymers on arc voltage and arc root position in the arc chamber during arc motion. The experimental results prove the validity of the numerical investigation.
  • Junya SEKIKAWA, Takumi SUGIO, Takayoshi KUBONO
    原稿種別: PAPER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1249-1254
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    Break arcs are generated in a DC 42V-10A resistive circuit. The contact material is Ag or Ag/ZnO. The number of break operations is two hundreds for each contact material. The motion of break arcs is observed with a high-speed camera. Relationship between the dependence of arc duration on the number of operations and the motion of arc spots is investigated. The following results are shown. For Ag contacts the arc duration is almost constant independent to the number of break operations. For Ag/ZnO contacts, on the other hand, the arc duration changes irregularly to short (59ms) or long (69ms) arc-duration after 30th break operation. The moving range of arc spots on contact surfaces is broad for the case of short arc-duration and is narrow for the case of long arc-duration. The cause of the results for Ag/ZnO contacts is considered that the difference of the boiling points of Ag and ZnO leads to the porous structure on the contact surface.
  • Junya SEKIKAWA, Takayoshi KUBONO
    原稿種別: PAPER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1255-1260
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    Motion of break arcs driven by external magnetic field is observed using a high-speed camera. The magnetic field is applied with a permanent magnet. Experimental circuit is DC42 V-10A resistive circuit. Material of electrical contacts is silver. Following results are shown. The break arcs are driven in the direction according to Lorentz force. The arc duration decreases with decrease of the distance between the electrical contacts and the magnet. When the external magnetic-flux density at the position of the break arc is lower than a certain value, the effect of the magnetic field to drive the break arc becomes ineffective to shorten the arc duration. The result is explained with a relationship between the motion of break arc and the distribution of the external magnetic field.
  • Ruicheng DAI, Degui CHEN, Xingwen LI, Chunping NIU, Weixiong TONG, Hon ...
    原稿種別: PAPER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1261-1267
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    The gas-puffer effect has important effects on the interruption capability of a molded case circuit breaker (MCCB). In this paper, on the basis of a simplified model of an arc chamber with a single break, the effect of back-volume of an arc-quenching chamber on arc behavior in an MCCB is investigated. Firstly, using a 2-D optical-fiber arc-motion measurement system, experiments are performed to study the effect of back-volume on the arc-motion and gas pressure in an arc-quenching chamber. We demonstrate that the lower back-volume of the arc-quenching chamber is, the higher the pressure and the better the arc motion will be. Then, corresponding to the above experiments, the gas pressure inside the arc-quenching chamber is calculated using the integral conservation equation. The simulation results are consistent with the experimental results.
  • Junya SEKIKAWA, Naoki MORIYAMA, Takayoshi KUBONO
    原稿種別: PAPER
    専門分野: Arc Discharge & Related Phenomena
    2008 年E91.C 巻8 号 p. 1268-1272
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    In a D.C.42V-10A resistive circuit, break arcs are generated between electrical contact pairs. The materials of the contact pairs are Ag, Ag/C 2wt%, Ag/SnO2 12wt%, and Ag/ZnO 12wt%. The arc spectral intensities are measured by a time-resolved spectroscopic temperature measurement system. The arc temperature is calculated from the spectral intensities by using the method of relative intensities of two spectra. The experimental results are as follows. The arc temperature gradually decreases with increase of the gap of electrical contacts. The ranges of arc temperature for Ag, Ag/C 2wt%, Ag/SnO2 12wt%, and Ag/ZnO 12wt% contacts pairs are 4500-11000K, 4000-6000K, 4000-7000K, and 4000-11000K, respectively.
  • Yingyi LIU, Degui CHEN, Chunping NIU, Liang JI, Weixiong TONG
    原稿種別: PAPER
    専門分野: Contactors & Circuit Breakers
    2008 年E91.C 巻8 号 p. 1273-1279
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    In the optimum design of AC contactors, it is important to analyze the dynamic behavior. Moreover, movable contact and core bounces have remarkable effect on the lifetime of contactors. According to a new kind of contactor with feedback controlled magnet system, this paper builds two different sets of periodically inter-transferred equations to obtain the dynamic characteristics of the contactor. The equations describe the coupling of the electric circuit, electromagnetic field and mechanical system taking account of the influence of friction. Then, the paper gives an optimum design to the dimension and the duty ratio of the contactor' pulse modulated wave (PWM) under different exciting, and proves, by experiment and simulation, that the bounce time of the contactor working in the optimized duty ratio is much less than that of the general AC contactors.
  • Degui CHEN, Liang JI, Yunfeng WANG, Yingyi LIU
    原稿種別: PAPER
    専門分野: Contactors & Circuit Breakers
    2008 年E91.C 巻8 号 p. 1280-1285
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    This paper simulates the dynamic behavior of the operating mechanism of ACB, and analyzes factors influencing the mechanism's operating time. First, it builds a dynamic model for the mechanism with virtual prototype technology. Experiment validation is carried out to prove the correctness of the model. Based on this model, it puts emphasis on analyzing the influence of electro-dynamic repulsion force on the operating time of the mechanism. Simulation and experimental results show that after adding electric repulsion force to the model, the operating time is shortened about 1.1ms. Besides the repulsion force, other influencing factors including the stiffness of opening spring, locations of every key axis, mass and centroidal coordinates of every mechanical part are analyzed as well. Finally, it makes an optimum design for the mechanism. After optimization, the velocity of operating mechanism is improved about 6.7%.
  • Chunping NIU, Degui CHEN, Xingwen LI, Yingsan GENG
    原稿種別: PAPER
    専門分野: Contactors & Circuit Breakers
    2008 年E91.C 巻8 号 p. 1286-1291
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    To predict the thermal behavior of switchgear quickly, the Thermal Network Finite Difference Analysis method (TNFDA) is adopted in thermal analysis of AC contactor in the paper. The thermal network model is built with nodes, thermal resistors and heat generators, and it is solved using finite difference method (FDM). The main circuit and the control system are connected by thermal resistors network, which solves the problem of multi-sources interaction in the application of TNFDA. The temperature of conducting wires is calculated according to the heat transfer process and the fundamental equations of thermal conduction. It provides a method to solve the problem of boundary conditions in applying the TNFDA. The comparison between the results of TNFDA and measurements shows the feasibility and practicability of the method.
  • Honggang XIANG, Degui CHEN, Xingwen LI, Weixiong TONG
    原稿種別: PAPER
    専門分野: Contactors & Circuit Breakers
    2008 年E91.C 巻8 号 p. 1292-1298
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    Short-time withstand current is one of the crucial nominal parameters in air circuit breaker. A numerical method to evaluate the short-time withstand current is proposed. Cylindrical current carrying bridge is introduced to describe the contact spot between movable and fixed contacts. Taking into account the action of ferromagnetic splitter plates, the variation of the conductor properties with temperature and the variation of contact spot radius with the electro-dynamic repulsion force, a transient finite element calculation model is developed by coupling the electromagnetic field and thermal field. The loaded short circuit current is considered as the short-time withstand current once the highest temperature is near to the melting point of the contact material. It demonstrates that the method is useful to evaluate the performance of the air circuit breaker.
  • Xiaohua WANG, Mingzhe RONG, Juan QIU, Dingxin LIU, Biao SU, Yi WU
    原稿種別: PAPER
    専門分野: Contactors & Circuit Breakers
    2008 年E91.C 巻8 号 p. 1299-1305
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    A new type of algorithm for predicting the mechanical faults of a vacuum circuit breaker (VCB) based on an artificial neural network (ANN) is proposed in this paper. There are two types of mechanical faults in a VCB: operation mechanism faults and tripping circuit faults. An angle displacement sensor is used to measure the main axle angle displacement which reflects the displacement of the moving contact, to obtain the state of the operation mechanism in the VCB, while a Hall current sensor is used to measure the trip coil current, which reflects the operation state of the tripping circuit. Then an ANN prediction algorithm based on a sliding time window is proposed in this paper and successfully used to predict mechanical faults in a VCB. The research results in this paper provide a theoretical basis for the realization of online monitoring and fault diagnosis of a VCB.
  • Yu-ichi HAYASHI, Hideaki SONE
    原稿種別: PAPER
    専門分野: Signal Transmission
    2008 年E91.C 巻8 号 p. 1306-1312
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    When contact failure occurs in a connector in a coaxial HF signal transmission line, an electromagnetic field is radiated around the line. We have measured the electromagnetic field and examined the characteristics of such radiation. The results show that the radiation is related to the contact resistance and the symmetry of the distribution of contact points at the connector. When contact resistance is low, radiation is observed at resonant frequencies related to the length of the transmission line. If a connector has axially asymmetric contact points, its radiation is higher than that when the contact points are symmetric. We show that if contact points in a connector are axially symmetrical with resistance lower than 0.25Ω, the electromagnetic interference caused by the connector contact failure is as low as the background noise.
Special Section on Microelectronic Test Structures (ICMTS2007)
  • Yoshio MITA
    2008 年E91.C 巻8 号 p. 1313-1314
    発行日: 2008/08/01
    公開日: 2018/07/01
    ジャーナル 認証あり
  • Weidong TIAN, Joe R. TROGOLO, Bob TODD
    原稿種別: INVITED PAPER
    専門分野: INVITED
    2008 年E91.C 巻8 号 p. 1315-1320
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    Capacitor mismatch is an important device parameter for precision analog applications. In the last ten years, the floating gate measurement technique has been widely used for its characterization. In this paper we describe the impact of leakage current on the technique. The leakage can come from, for example, thin gate oxide MOSFETs or high dielectric constant capacitors in advanced technologies. SPICE simulation, bench measurement, analytical model and numerical analyses are presented to illustrate the problem and key contributing factors. Criteria for accurate capacitor systematic and random mismatch characterization are developed, and practical methods of increasing measurement accuracy are discussed.
  • Chun-Yu LIN, Ming-Dou KER, Guo-Xuan MENG
    原稿種別: PAPER
    2008 年E91.C 巻8 号 p. 1321-1330
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    With the smaller layout area and parasitic capacitance under the same electrostatic discharge (ESD) robustness, silicon-controlled rectifier (SCR) has been used as an effective on-chip ESD protection device in radio-frequency (RF) IC. In this paper, SCR's with the waffle layout structures are studied to minimize the parasitic capacitance and the variation of the parasitic capacitance within ultra-wide band (UWB) frequencies. With the reduced parasitic capacitance and capacitance variation, the degradation on UWB RF circuit performance can be minimized. Besides, the fast turn-on design on the low-capacitance SCR without increasing the I/O loading capacitance is investigated and applied to an UWB RF power amplifier (PA). The PA co-designed with SCR in the waffle layout structure has been fabricated. Before ESD stress, the RF performances of the ESD-protected PA are as well as that of the unprotected PA. After ESD stress, the unprotected PA is seriously degraded, whereas the ESD-protected PA still keeps the performances well.
  • Toshihiro MATSUDA, Yuya SUGIYAMA, Keita NOHARA, Kazuhiro MORITA, Hidey ...
    原稿種別: PAPER
    2008 年E91.C 巻8 号 p. 1331-1337
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    A test structure to analyze asymmetry and orientation dependence of MOSFETs is presented. n-MOSFETs with 8 different channel orientation and three kinds of process conditions were measured and symmetry characteristics of IDsat and IBmax with respect to the interchange of source and drain was examined. Although both IDsat and IBmax have similar channel orientation dependence, IBmax in interchanged S/D measurements shows asymmetrical characteristics, which can be applied to a sensitive method for device asymmetry detection.
  • Masako FUJII, Koji NII, Hiroshi MAKINO, Shigeki OHBAYASHI, Motoshige I ...
    原稿種別: PAPER
    2008 年E91.C 巻8 号 p. 1338-1347
    発行日: 2008/08/01
    公開日: 2010/03/01
    ジャーナル 認証あり
    We propose a new large-scale logic test element group (TEG), called a flip-flop RAM (FF-RAM), to improve the total process quality before and during initial mass production. It is designed to be as convenient as an SRAM for measurement and to imitate a logic LSI. We implemented a 10 Mgates FF-RAM using our 65-nm CMOS process. The FF-RAM enables us to make fail-bit maps (FBM) of logic cells because of its cell array structure as an SRAM. An FF-RAM has an additional structure to detect the open and short failure of upper metal layers. The test results show that it can detect failure locations and layers effortlessly using FBMs. We measured and analyzed it for both the cell arrays and the upper metal layers. Their results provided many important clues to improve our processes. We also measured the neutron-induced soft error rate (SER) of FF-RAM, which is becoming a serious problem as transistors become smaller. We compared the results of the neutron-induced soft error rate to those of previous generations: 180nm, 130nm, and 90nm. Because of this TEG, we can considerably shorten the development period for advanced CMOS technology.
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