This study was conducted to examine the possibility of monitoring growth and yield estimation of rice utilizing high resolution SAR satellite data (X-band, dual-polarized). We considered a quantitative understanding of the relationship between changes in the backscattering coefficient and changes in growth and yield of rice.
Results indicated that with 11 day repeat pass of TerraSAR-X satellite data, it was possible to observe the time series changes of the backscattering coefficient of rice growth. The polarized TerraSAR-X data indicated the possibility to estimate growth conditions of the stems and plant height due to high correlation between TerraSAR-X data and the stems, the rate of vegetation cover during phonological stage. In addition, there was a correlation between the HH polarization and grains, ripening rate of the crop growth period from heading stage to pre-maturing stage. The yield was correlated with the HH polarization of 49° angle of incidence at the heading stage and VV polarization or HH×VV dB of 49° angle of incidence before maturation stage.
Utilizing the SAR data (X-band, dual-polarized) of the time series was highly effective for monitoring the plant growth and yield estimation.
In the future work, based on the relationship between the crop growth, yield and obtaining the backscattering coefficients during multiple years, considerations of climatic changes, it would be significant to develop a comprehensive crop growth model derived from the regression equations to estimate the SAR backscattering coefficients. Additionally, we intend to expand the growth models for yield predictions.
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