For VIA hole drilling into printed-wiring boards using a CO
2 laser, one of the critical issues is some insufficient electrical conduction by the thin layer of residual resin, so-called “smear,” on the inner circuits after the drilling. In general, smear over 2 μm thick cannot be removed by a chemical etching process. In this study, a novel in-situ process monitoring technology for laser drilling was developed to overcome this issue. During the laser drilling process, the amount of smear can be estimated by detecting the light emission generated from the reductive reaction of copper oxide on the inner circuits. Depending on the thickness of the smear, the number of laser pulses is controlled to keep it below 2 μm. This technology enables a VIA hole drilling system with high reliability.
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