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Kohji KOSHIJI
1998 Volume 1 Issue 6 Pages
445
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Atsushi NAKAMURA, Mitsuaki KATAGIRI, Tohru HAYASHI
1998 Volume 1 Issue 6 Pages
446-450
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Yoshiyuki HATTORI
1998 Volume 1 Issue 6 Pages
451-456
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Bruce ARCHAMBEAULT, Albert E. RUEHLI
1998 Volume 1 Issue 6 Pages
457-460
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Nobuo IWASE
1998 Volume 1 Issue 6 Pages
461-465
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Osami WADA
1998 Volume 1 Issue 6 Pages
466-470
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Hiroshi WABUKA, Naoya TAMAKI, Norio MASUDA
1998 Volume 1 Issue 6 Pages
471-475
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Naoshi NAKAYA, Akinori KANASUGI, Kunio KONDO
1998 Volume 1 Issue 6 Pages
476-482
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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In this paper, we propose a new placement method, which can treat of arbitrary shape blocks. In the proposed method, we place the blocks using the value that is based on the shape of block. The method is able to handle the blocks that include notches with restricted layout area. We can also search effective placements because the order of placement is controlled by Genetic Algorithm. We have made computer experiments by the automatic placement tool for proposed method. The computer experiments show that the results of proposed methods are effective placements without wasteful area.
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Junichi ISHIBASHI, Takeshi KOBAYASHI, Takumi ICHIKAWA, Hideo HONMA
1998 Volume 1 Issue 6 Pages
483-488
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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As the conductor density of the printed circuit boards increases with the demand for miniaturization of the electronic devices, the build-up method has been paid attention to achieve the requirement. The build-up method is a new manufacturing process accumulating an insulation layer and a conductive layer sequentially on the core circuit boards. The fundamental technologies such as selection of insulator, formation of via-holes and preparation of fine patterns are required to further improve this process. Among them, the adhesion strength between the copper conductor and insulation layer is significant to improve the connection reliability. This paper describes an improvement of adhesion strength between the copper and insulation layer using the additives in the electroless copper plating bath. Adhesion measurements were conducted using photoimageable resin and unclad resin. The adhesion strength was 1.14kgf/cm for the photoimageable resin and 1.43kgf/cm for the unclad resin with potassium thiocyanate added bath, with which tear fragments of the resin were observed on the detached copper side. On the other hand, the adhesion strength was not improved with additive-free and thiomalic acid added bath.
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Jiro OOUCHI, Kenichi ITO
1998 Volume 1 Issue 6 Pages
489-494
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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It is known that multiple decoupling capacitors with series resistors, which can prevent impedance from increasing at the anti-resonance frequency, are effective for noise reduction at higher radio frequencies. Clock speed of a digital circuit now often exceeds 100MHz. Therefore, 3 or more decoupling capacitors are neccesary to reduce the radiation noise from such digital circuits. But in case of 3 decoupling capacitors with series resistors connected in parallel, it is impossible to solve the five-degree impedance equation analytically. The optimum value of the resistor to minimize the impedance is found with a circuit simulator and the results were convinced by measurements.
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Masakaze HOSOYA, Nobuo SATO, Hideki TSUNETSUGU
1998 Volume 1 Issue 6 Pages
495-499
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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This paper reviews a new packaging technique using Lead-less Super Broadband (LSuB) carrier for high-speed IC module. The LSuB carrier drastically reduces the parasitic inductive elements of the interconnection between IC and package terminals, and provides an impedance matched interconnection. The LSuB carrier realized the insertion loss of less than 1.3 dB from DC to 50 GHz. The fabricated package module using the LSuB carrier achieved a 3-dB bandwidth of more over 40 GHz.
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Yoshinori SHIMIZU
1998 Volume 1 Issue 6 Pages
500-508
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Hideyuki NISHIDA, Kazunori SAKAMOTO
1998 Volume 1 Issue 6 Pages
509-514
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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Takeo SHIMIZU
1998 Volume 1 Issue 6 Pages
515-519
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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[in Japanese]
1998 Volume 1 Issue 6 Pages
521
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
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[in Japanese]
1998 Volume 1 Issue 6 Pages
522-523
Published: November 01, 1998
Released on J-STAGE: March 18, 2010
JOURNAL
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