Journal of The Japan Institute of Electronics Packaging
Online ISSN : 1884-121X
Print ISSN : 1343-9677
ISSN-L : 1343-9677
Volume 26, Issue 3
Displaying 1-20 of 20 articles from this issue
Preface
Special Articles / Integrated Optical Device Module Packaging Technology for 50 Tb/s Ultra-Large Capacity Network Switch Generation
Technical Paper
  • Kohei Mitsui, Mizuki Yamamoto, Kentaro Kawai, Tatsuya Kobayashi, Ikuo ...
    Article type: Technical Paper
    2023 Volume 26 Issue 3 Pages 266-274
    Published: May 01, 2023
    Released on J-STAGE: May 02, 2023
    Advance online publication: February 17, 2023
    JOURNAL RESTRICTED ACCESS

    We investigated how adding Ni and Cu into Sn-6.4Sb-3.9Ag (mass%) lead-free solder affects its fatigue properties at high temperatures. The addition of Ni and Cu caused the formation of grains with high-angle grain boundaries and an increase in the number of grains. From the fatigue test, the solder with added Ni was confirmed to have superior fatigue properties at 175°C. The solder with added 0.4%Ni was confirmed to have the best fatigue properties. In contrast, in the solder with added Ni and Cu, the addition of 2.0%Cu in the solder degraded its fatigue properties at 175°C. From EBSD analysis, it was found that cracks grow at grain boundaries with dynamic continuous recrystallization in the solder with added Ni and 1.0%Cu. On the other hand, the fatigue damage in the solder with added 2.0%Cu was due to stress relaxation by dynamic recovery.

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  • So Tanaka, Jiro Shinkai, Hiroshi Hozoji, Fumiki Kato, Masato Ikegawa, ...
    Article type: Technical Paper
    2023 Volume 26 Issue 3 Pages 275-282
    Published: May 01, 2023
    Released on J-STAGE: May 02, 2023
    Advance online publication: March 07, 2023
    JOURNAL RESTRICTED ACCESS

    This paper reports on the development of a SiC power device packaging technology that extends the power-cycling lifetime to 300,000 cycles at temperatures above 200°C, which is the criterion for high-reliability applications. By mounting a buffer layer with an adjusted coefficient of thermal expansion (CTE) less than that of SiC, the creep-fatigue of the aluminum chip electrode is suppressed and lifetimes of 472,000 cycles at 65 to 200°C and 425,000 cycles at 65 to 225°C are achieved. In addition, the mechanism of the lifetime extension is discussed using cross-sectional structural observation, transient thermal resistance analysis, and stress-strain simulation utilizing the finite element method.

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  • Masato Tsuchiya, Sachio Yoshihara, Taishi Shibata, Katsuji Nakamura
    Article type: Technical Paper
    2023 Volume 26 Issue 3 Pages 283-289
    Published: May 01, 2023
    Released on J-STAGE: May 02, 2023
    Advance online publication: April 14, 2023
    JOURNAL RESTRICTED ACCESS

    The recycling of solder materials, including those used for electronics mounting, will be increasingly desirable considering the demands of SDGs. There will also be greater diversification of anode composition in electrorefining. These tendencies will reduce the purity of anode materials. The electrorefining process is a key technology for recovering Sn from used materials. It has been reported that anode electrodes containing various impurity metals tend to be passivated easily. Anode passivation reduces refining purity. In this study, we evaluated the effect of Sn anode composition on passivation time in a sulfate bath under an electrorefining process. Some of the tin anode impurities considered are Bismuth and Antimony, though there are others. In this report we clarify that specific amounts of Bi in Sn-Sb material led to anti-passivation.

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