Electron binding energies of Al, O, and S atoms in anodic oxide films formed on aluminum in aqueous solutions of H
2SO
4, Na
2SO
4, NH
4HB
4O
7, Na
2SO
3, etc. at constant current densities were measured by means of X-ray photoelectron spectroscopy. The results obtained were as follows: 1) Binding energies of Al
2P, Al
2S and O
1S electrons in anodic oxide films formed on Al in sulfuric acid were located at 74.9, 119.9 and 532.2eV, respectively. The binding energies were measured under the same condition as above in the anodic oxide films formed in other electrolytes. As the results, the binding energy of Al
2P electron in anodic oxide films shifted by 0.3eV from the energies of Al oxides (αAl
2O
3=βAl
2O
3=γAl
2O
3:74.6eV) or of anodic oxide films sealed with boiling water. 2) Binding energies of S
2P electron of sulfate in anodic oxide films formed on Al in aqueous solutions of H
2SO
4, Na
2SO
4, KAl(SO
4)2·12H
2O, NaHSO
3, Na
2SO
3, and Na
2S
2O
3·5H
2O were located at 169.8, 170.1, 170.1, 168.4, 168.6 and 168.4eV, respectively.
抄録全体を表示