Electropolished 99.99% Al foil coupons were anodized in H
2SO
4 solutions of 0.5-4.0mol·dm
-3 at 10-40°C, by applying a constant current in a range of 0.5-50mA·cm
-2, Morphology of the oxide films was examined using electronmicroscopic and electrochemical techniques. For the accurate estimation of the number of pores, N, from electronmicrographs, the pores were widened by chemical dissolution of the oxide in a H
2SO
4 solution before the film was stripped from the substrate metal. The total film thickness, h, was estimated from the sections of films under a scanning electronmicroscope, and the pore radius, r, was calculated from the porosity of the oxide, α(=Nπr
2), measured by the pore-filling method proposed by Middelhoek. The estimation of the barrier layer thickness, δ
b, was made according to Hunter's principle by measureing the voltage jump, E
j, when applying a small anodic current in a neutral borate solution. The thickness/voltage ratio, δ
b/E
j, was determined from the time-variations in the pore-wall thickness, δ
p, and E
j during chemical dissolution of the oxide, on an assumption that δ
b and δ
p thin at equal rates. In agreement with the results reported previously, N decreases and r and δ
b increase as the anodizing voltage, E
a, increases, but the results of this investigation clearly show that these quantities are solely the function of E
a although E
a is strongly affected by the solution condition and anodizing c.d. It is demonstrated that δ
b/E
a ratio is not constant but decreases with increasing E
a. For films formed with a fixed number of coulombs, the value of h somewhat increases with increasing E
a, solution concentration and temperature. The density of oxide ρ, is estimated to be 3.0-3.5 by dividing the weight of the film by the oxide volume calculated from the values of h, N, r and the chemical dissolution rate of the pore-wall during anodizing. It is interesting to note that ρ decreases with increasing E
a, solution concentration and temperature. The significance of the techniques of determining the quantities describing the film structure is discussed.
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