金属表面技術
Online ISSN : 1884-3395
Print ISSN : 0026-0614
ISSN-L : 0026-0614
35 巻, 11 号
選択された号の論文の4件中1~4を表示しています
  • 馬場 宣良, 渡辺 誠一
    1984 年 35 巻 11 号 p. 498-506
    発行日: 1984/11/01
    公開日: 2009/10/30
    ジャーナル フリー
  • 山崎 恒博, 三宅 益市, 津原 寛
    1984 年 35 巻 11 号 p. 507-512
    発行日: 1984/11/01
    公開日: 2009/10/30
    ジャーナル フリー
    A Salt film method has been developed for descaling stainless steel. Spraying methods of salt solution were tested in both laboratory and production line environments. The results of these tests are summarized as follows: 1. A wedge shaped test spray unit was developed for the spray of an alkaline solution to hot strips after annealing in a furnace. The device was operated stably even in high temperature atmospheres. 2. In laboratory tests of spray characteristics, adhesion efficiency of the sprayed solution on the strip surfaces was found to be a function of the spray distance, strip temperature, spray pressure and the gas-liquid flow rate. 3. Following incorporation of the salt film descaling method into a production line, it is expected that it will be improved to enable spraying strips at temperatures of un to 400°C.
  • 福田 豊, 福島 敏郎, 永山 政一
    1984 年 35 巻 11 号 p. 513-520
    発行日: 1984/11/01
    公開日: 2009/10/30
    ジャーナル フリー
    Commercially pure aluminum specimens were anodically oxidized in a 13M H2SO4 solution at 20°C by applying a constant current density of 1A·dm-2, the voltage attained being 36-38V. The composition and properties of the oxide formed were investigated by chemical analysis, electrochemical techniques, thermogravimetric analysis, and transmission electron microscopy. The results were compared with those for oxide films formed in a 1.5M solution. (1) The content of SO42- and H2O were about 40% and 6.5% respectively for the 13M film and 15% and 5.5% for the 1.5M film. Thus, film composition is expressed by Al2O2.29 (SO4)0.71⋅;0.61H2O and Al2O2.81 (SO4)0.19⋅0.38H2O. (2) For the 13M films, the thickness of the barrier layer was 330Å and that of the pore wall 270Å, pore diameter was 200Å. The number of pores was 19.6×109cm-2 for the 13M film and 72.1×109cm-2 for the 1.5M film. (3) The rate of chemical dissolution of both 13M and 1.5M films was higher in the 1.5M H2SO4 solution than that in the 13M solution. In both solutions, the 13M film dissolved faster than the 1.5M film, due to its larger SO42- content. (4) Microvoids were found to have been produced in the barrier layer and pore walls of the 13M film by the expansion of oxide due to the incorporation of a large number of SO42- ions. Because microvoids were present in both the barrier layer and the pore walls, density and abrasion resistance were lower for the 13M film than for the 1.5M film.
  • 吉村 俊一, 久保田 昇, 佐藤 栄一
    1984 年 35 巻 11 号 p. 521-526
    発行日: 1984/11/01
    公開日: 2009/10/30
    ジャーナル フリー
    The electrodeposition behavior of copper from Cu (en)22+, Cu (EDTA)2+ and mixture of their complex ions has been investigated. Cathodic current-potential curves were obtained by using a rotating disk electrode and the resistance polarization due to the iR-drop between the electrode and the Luggincapillary was eliminated from the data by the current interrupter method. The slope b of the Tafel relation and the cathodic transfer coefficient α of the discharge reaction of Cu (en)22+ complex ions were -550mV and 0.145, respectively, at potentials from -750- -1100mV (SCE). Analoguos values for Cu (EDTA)2+ complex ions were -250mV and 0.436, respectively, at potentials from -1100- -1250mV (SCE). The exchange current density io was determined by extrapolating the Tafel relation to the equilibrium potential, was higher for Cu (en)22+ than for Cu (EDTA)2+.
    Further more, for the ligand mixed solution consisting of Cu (EDTA)2+ to which etylenediamine had been added, the complexation reaction written
    Cu (EDTA)2++nen_??_Cu (en)22+, Cu (en)32+, EDTAfree
    was controlled by the stability constants of the complex ions (βEDTA=18.8, βen=20.0, βen=19.1). The electrodeposition behavior of copper from mixture of Cu (en)22+ and Cu (EDTA)2+ complex ions is thought to be dependent on electrodeposition of Cu (en)22+ complex ions.
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