表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
37 巻 , 4 号
選択された号の論文の12件中1~12を表示しています
巻頭言
特集:実用表面分析の最前線
  • 山瑞 拡路, 井上 りさよ, 眞田 則明, 渡邉 勝己
    原稿種別: 研究紹介
    2016 年 37 巻 4 号 p. 150-155
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
    Hard X-ray photoelectron spectroscopy (HAXPES) has recently attracted attention for its unique capabilities. High energy X-ray enables to excite deep core level electrons and in parallel the information depth from the sample surface is significantly larger than conventional XPS, which enables to investigate electronic structures beneath the sample surface and buried interface without destructive ion etching. Although most of the previous HAXPES studies have been conducted with synchrotron radiation source, laboratory HAXPES is getting more and more attracted in practical applications. In this review, we report unique capabilities of the laboratory HAXPES with our recent applications, which has both of soft and hard X-ray as excitation sources.
  • 堤 建一, 田中 章泰, 島 政英, 小野寺 浩
    原稿種別: 研究紹介
    2016 年 37 巻 4 号 p. 156-161
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
    AES and XPS have been used to analyze the top surface of a solid sample for a long time. In late years scientific reports including an AES result became less than those of XPS year by year. It originates in superior several points of XPS; easy non-conductive sample analysis, quantitative analysis with higher accuracy, and excellent chemical state analysis. However, AES can acquire additional information from a minute area of a few tens of nm, which cannot be attainable by XPS. It was usually very important to understand a true sample surface condition more deeply. We have done lots of Auger applications for a long time, in order to extend AES capability to analyze many kinds of samples. In this report, we introduce recent applications of AES; non-conductive sample analysis and chemical state analysis. They are useful techniques and can be applied to many practical samples.
  • 小林 大介
    原稿種別: 研究紹介
    2016 年 37 巻 4 号 p. 162-166
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
    Elemental identification of unknown mass/charge peaks is one of the capabilities required by corporate users who are in charge of time-of-flight secondary ion mass spectrometry (TOF-SIMS). An accurate mass scale is essential to identify the unknown peaks. A conventional method for the mass scale calibration that uses only low-mass CXHY fragment ions does not provide precise relative mass accuracy to high-mass peaks. On the other hand, a novel method using molecular ions of internal additives is shown to improve the relative mass accuracy of high-mass peaks.
  • 石川 丈晴, 坂本 哲夫
    原稿種別: 研究紹介
    2016 年 37 巻 4 号 p. 167-172
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
    The shape and structure, component distribution of nano-scale areas have significant effect on the property of materials in a variety of fields. SIMS is a surface analytical method for measuring the mass-to-charge ratio of the secondary ions generated by the irradiation of an ion beam to the surfaces. It is possible to obtain the mass image of nano-scale area by scanning an ion beam of several tens of nm size and by detecting secondary ions effectively. Such instrument is called “Nano-SIMS”. It is a powerful tool that can evaluate the relationship between the structure and component distribution and physical properties in the various fields. In this paper, we describe the concept and introduction of instrument, application of itself and the future prospects for Nano-SIMS.
  • 町田 雅武, 野副 尚一, Bjorn AHMAN, 大岩 烈
    原稿種別: 研究紹介
    2016 年 37 巻 4 号 p. 173-177
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
    X-ray Photoelectron Spectroscopy (XPS) is a powerful tool for direct observation of chemical state of materials. Various kinds of instruments that are optimized for high energy resolution, high angular resolution, or high spatial resolution are developed and are used according to each applications. In general, XPS measurements are performed with the condition of high or ultra-high vacuum due to the attenuation length of X-ray and photoelectrons. At higher pressure, there is also a difficulty to apply high voltage to the XPS analyzer. On the other hand, demands for in-situ measurement are increasing. We have developed instruments for Near Ambient Pressure X-ray Photoelectron Spectroscopy (NAP-XPS) recently and some of them are already used at several institutes. Latest results and the future prospect of NAP-XPS are described in this article.
  • 二宮 啓
    原稿種別: 研究紹介
    2016 年 37 巻 4 号 p. 178-183
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
    Secondary ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS) have been used for the analysis of inorganic and organic materials. Recently, cluster ion beams have been utilized for the etching of organic materials for depth profiling in SIMS and XPS, and ionization in SIMS. In this paper, recent studies on different types of cluster ions for SIMS and XPS will be reviewed and summarized.
  • 齋藤 健
    原稿種別: 実験ノウハウ
    2016 年 37 巻 4 号 p. 184-186
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
連載企画
安全な社会と表面科学
  • 西田 泰
    2016 年 37 巻 4 号 p. 187-189
    発行日: 2016/04/10
    公開日: 2016/04/21
    ジャーナル フリー
    交通事故総合分析センターでは,関係省庁等から提供された交通事故や道路交通に関わるデータを使い様々な交通事故統合データベースを構築し,交通事故の防止と被害軽減に関する調査研究を行っている。ここでは,交通事故統合データベースと,そのデータベースを使った運転者や道路,車両に関する交通安全対策の検討や効果評価のための分析事例を紹介する。免許・事故違反履歴統合データベースの分析からは過去5年間の事故や検挙違反の回数が多い者ほどその後の事故率が高いこと,交通事故・道路統合データベースの分析からは事故多発地点の特徴は様々であり場所に応じた対策が必要なこと,また,交通事故・車両統合データベースの分析からはアクティブヘッドレストの頸部損傷の被害軽減やABSの追突事故の防止効果が確認される等,交通事故対策の効果や今後の交通事故対策の検討資料が得られている。
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