Effect of pre-aging at 243 K or 273K on subsequent aging at 263 K (two-step aging) in Al-4 mass%Zn alloy was studied by measurements of electrical resistance and small-angle X-ray scattering (SAXS) intensity.
When pre-aging time (
tApre) was relatively short (<600 s), the final value of the electrical resistivity (ρ
E) on the aging at 263 K was not affected by the pre-aging. As
tApre became longer (>600 s), complicated behavior of ρ
E was observed according to the change of
tApre at 243 K or 273 K.
In the case of pre-aging at 273 K the SAXS integrated intensity (
q0) of thick specimens after the aging at 263 K decreased gradually from the value of not pre-aged specimens (
q0263) with increasing
tApre. On the thick specimen pre-aged at 243 K, except when
tApre was very long,
q0 was, within experimental error, not affected by the pre-aging, regardless of the complicated change of ρ
E.
Concerning thin specimen pre-aged at 243 K, in which annihilation of the vacancies at the surfaces could not be neglected,
q0 after aging for long time at 263 K increased to
q0263 of the thick specimens, exceeding
q0 of the specimen aged at 263 K without pre-aging, as
tApre was increased. For very long
tApre q0 only reverted partially to a value larger than
q0263.
The SAXS results have been discussed in terms of reduction in concentration of quenched-in vacancies during the pre-aging and of volume fraction of GP zone.
In spite that
q0 that was attained on the pre-aging for not so long time at 243 K was fairly smaller than
q0263,
q0 reduced at the initial stages of subsequent aging at 263 K. It was considered that this reduction would suggest the dissolution of the small GP zones formed at 243 K, even though the solid solution was supersaturated.
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