Standardization of processable mode communication has been studing in CCITT as a functional standard of ODA (Open Document Architecture). The purpose of processable mode is to realize a multi-media document interchange between terminals or systems. This paper describes the recent activities of CCITT and ISO, and outlines of the specifications of processable mode communication.
We have been developing a component image database for scene synthesis. This paper describes a new scene generation method using that image database and a multi-layered image synthesizer. In this method, several component images transferred from the database are arranged on multiple layers in spatiotemporal domain and combined to a scene or a program itself. We call this method Spatiotemporal Editing. An experimental system was also developed and usefulness of this method was confirmed.
This paper describes motion detection method of moving objects. which do not change shape itself such as car. move smoothly. and do not suddenly turn. and which form is seen to be changed by 3-dimensional motion of objects, or operation of camera such as zoom. tilt, pan, and dolly. The proposed method is dividing objects into area where affine transformation is valid. and estimating affine transformation matrix in each area with similarity between frames. smoothness of motion. least square method. and dynamic programming. etc. after specifying detection, points on initial frame (and final frame in some cases)
The authors have developed a method for quickly identifyins the shape of a 3-D object. using a dot-matrix-like bright spots projection image. In this method, the polar coordinates transform is used in the frequency space of the image. and a multi-layered neural network is trained using the power spectrum of the transformation data. The translation and the rotation invariance of the object is performed by the preprocessing of the neural network.
In this paper, Efficiency of phase conjugate wavefront generation in Bi_<12>SiO_<20> crystals and application to measurement of surface defects on silicon wafer and fingerprint pattern are studied using laser beam of uniform intensity distrubution. Using the uniform laser beam. efficiency is 3〜6 times higher than when a non-uniform Ar laser of approximately gaussian intensity distribution is used. The reconstructed images of the defects and fingerprint pattern via phase conjugate wavefront generation is of high quality. It is concluded that the method is verv useful for the measurement of surface defects and fingerprint pattern.