Holographic pattern measuring system is a combined system of a holography and a graphic image processing technique. A distribution of microscopical displacement can be measured, and it can be analyzed as the three-dimensional graphic image. However, in the system, the interferometry data have been treated handly, so both the error and the time loss were inevitable. In this Study, the digital image signal processing system was developed, and the system was applied to detect fringes automatically from interferometry image. AS the results, more accurate pattern data could be clearly and speedily detected by using peek-detected processing method.
抄録全体を表示