Soft magnetic properties of Fe-Zr-C-N films fabricated by rf reactive sputtering in Ar+N_2 atmosphere were investigated. The as-deposited films having mixd phases of amorphous and bcc α-Fe or mostly crystaEine α-Fe phase showed nanocrystalline structure upon annealing. The best soft magnetic properties achieved in these films are; H_c of 0.06 Oe, μ_<pff> of 3150 (1MHz) and 4πM_s of 16.8 kG. The films exilibited high μ_<pff> of more than 2000 and 4πM_s. of about 1.6 kG when the Zr content is about 6.4-8.3 at% and the [C+N] cdntent is around 15.5-18.0 at%. The fine grained α-Fe structure, together with very fine Zr(C,N) precipitates which were formed at an early stage of crystallization is considered to be one of the main factors for the excellent soft magnetic propertiesn
NiFe/Cu artificial superlattices have been fabricated by rf-magnetron sputtering on Si(111) wafer substrates using thin copper layer as an underlayer. 11.7% magnetoresistance at room temperature is observed in a[Cu(22Å)/NiFe(20Å)]_20Cu(50Å)|Si(111) sample and the saturation field is measured to be 100 Oe. The artificial superlattices show in-plane uniaxial anisotropy with the easy axis parallel to the fiat edge direction (// Si<110>) of the wafer. The easy-axis magnetoresistance curve exhibited a multiple stepwise changing behavior and it turned out that the size of the plateau region of steps had a great influence on the saturation field.
Thin CoCrTa/Cr films were deposited on glass substrates at various temperature with or without Al micro-bumps. The coercivity of CoCrTa increased considerably by introducing the Al micro-bumps as a texture layer. The cause of the coercivity increase is attributed to the development of stronger (1011) texture of Co grains which is related to lattice expansion of Cr underlayer by Al addition to Cr lattice. The Morphology of CoCrTa/Cr/Al films was also observed. The size and shape of Al micro-bumps was very sensitive to the thickness of the Al films and the substrate temperature.
In overwrite recording on thick recording media, recording dips or so-called "re-recording phenomena" have been observed. In this paper, the overwrite characteristics for thin recording media such as metal evaporated tape are reported. It was experimentally confirrmed that recording dips in over-write characteristics occur for thin media as well as for thick recording media, when some recording conditions were satisfied. To explain the characteristics, the effects of internal field and rotating vectorial head field are discussed.