Secondary electron emission (SEE) coefficient a and inelastic reflection coefficient η of Octoil-S, DC-704, and DC-705 have been studied by a pulsed-beam method in the primary range 502000 eV. For these three specimens, the maximum values of a are 2.8, 2.0, and 2.0, respectively, and the primary energies corresponding to the maximum a are equally 200 eV. The maximum values of η are 0.14, 0.17, and 0.17, respectively. SEE properties of DC-705 are analyzed by using δ-η diagram (δ =σ-η) and the effective maximum emission depth of true secondaries is determined to be 2030Å. The results are compared with those for other molecular substances. It is also shown that the observation of SEE gives a very sensitive method for detecting organic contamination in vacuum systems.
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