Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Volume 7, Issue 7
Displaying 1-4 of 4 articles from this issue
  • Kiyoji TSUTSUI
    1964 Volume 7 Issue 7 Pages 236-242
    Published: July 20, 1964
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
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  • Hisao KOMORI
    1964 Volume 7 Issue 7 Pages 243-246
    Published: July 20, 1964
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
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  • Takeo FUJINO
    1964 Volume 7 Issue 7 Pages 247-252
    Published: July 20, 1964
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    The calibration of a Pirani gauge has been performed for various gases of H2, N2, He, and A. The Pirani gauge usxl. for this calibration was constructed for the study of “the flow rates of various gases through narrow gaps at low pressures.” The gauge can be operated by a simple constant D. C. power supply. The calibration system consists of a large volume tank, a variable leak and a burette for measuring small flow rates of various gases at low pressure. The calibration curves obtained with large flow rates showed deviations from a straight line by 14% near the lowest pressure ; the deviation was found to be largest for N2 and smallest for H2. The cause for the deviation was investigated and concluded to be slow gauge responses for press re changes. The calibration curves with acaracys of 2% were obtained with the gas flow rates between 1. 5 and 2μHg /lsec. The pressure sensitivities of the gauge for the various gases were investigated by measuring the amounts of the heat cons 1mption. The results show in general agreement with the theory.
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  • Ryuzo UEDA, Yasuhiko YAMAMOTO
    1964 Volume 7 Issue 7 Pages 253-258
    Published: July 20, 1964
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    The aging effect of the electlical resistance of nickel, copper, and Ni-Cu films and resistance-strain characteristics (strain coefficient or gauge-factor K) are measured in a vacuum bell jar. These effects depend on the thickness of films. The gauge-factor K of relatively thick films tends to approach the value of the bulk one, and the resistance of films decreases with time just after the evaporation. The K-factot of a relatively thin film is larger than that of the bulk, and its resistance increases with time after the evaporation. The gauge-factor K of the films of intermediate thickness has a minimum value and the resistance varies gradually with time.
    The imperfections of the films produced by evaporation or adsorption of gases are seemed to affect on the electrical and mechanical properties of the films.
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