Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Volume 49, Issue 11
Displaying 1-10 of 10 articles from this issue
Special Issue 1: Recent Progess in Scanning Probe Microscopy for Nanofabrication and Nanofunctionality
Foreword
Reviews
Special Issue 2: The Frontier of Developments for the X-ray Free Electron Laser
Reviews
  • Yoshiyuki AMEMIYA
    2006 Volume 49 Issue 11 Pages 673-677
    Published: 2006
    Released on J-STAGE: June 29, 2007
    JOURNAL FREE ACCESS
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  • Tetsuya ISHIKAWA, Tsumoru SHINTAKE, Hideo KITAMURA
    2006 Volume 49 Issue 11 Pages 678-682
    Published: 2006
    Released on J-STAGE: June 29, 2007
    JOURNAL FREE ACCESS
    Download PDF (618K)
  • Makoto SAKATA
    2006 Volume 49 Issue 11 Pages 683-688
    Published: 2006
    Released on J-STAGE: June 29, 2007
    JOURNAL FREE ACCESS
      XFEL (X-ray Free Electron Laser) has a great potential to many different scientific fields, such as materials science, structural biology and so on. The technology involved in the usage of XFEL is not simple extension of the present technology. It demands different kinds of breakthroughs. At the present stage, when the realization of XFEL is still 4 to 5 years away, various trials are undertaken by utilizing the existing 3rd generation SR sources. This article is reviewing such activities focused on the imaging of non-crystalline materials by coherent X-ray beam. The aim of the activities is to visualize atomic structure from a single molecule, which seems to be a great deriving force to realize XFEL. In the present article, two different approaches are reviewed. One is the phase reconstruction by over-sampling method and the other is to record the phase by holographic technique by taking advantage of coherent beam.
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