Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Volume 14, Issue 2
Displaying 1-3 of 3 articles from this issue
  • Tadashi SAWADA, Kenji MURAKAMI
    1971 Volume 14 Issue 2 Pages 33-41
    Published: February 20, 1971
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
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  • Hifumi TAMURA, Shigehiko YAMAMOTO, Toshio KONDO
    1971 Volume 14 Issue 2 Pages 42-53
    Published: February 20, 1971
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    Using an IMA (Ion Micro-probe Mass Analyzer) secondary ion emissions from, Ni, Mn, and Cu surfaces were measured and the influence of gas adsorption on the secondary ion yield was studied. Argon primary ion beam of 10 KeV was used. The relative secondary ion yields were found to be 1, O. 25, and O. 24 for Ni, Mn, and Cu, respectively. The presence of some adsorbates on metal surfaces affects on the work function of metals, and hence the secondary ion yield is considered to suffer the influence. The adsorbate layers are, however, removed by the bombardment of the primary ions. It was found that higher beam power is required to remove the adsorbate layer on Cu surface than to remove the layer on Ni Surface.
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  • Kimio INAOKA, Hokotomo INOUYE
    1971 Volume 14 Issue 2 Pages 54-55
    Published: February 20, 1971
    Released on J-STAGE: September 29, 2009
    JOURNAL FREE ACCESS
    Download PDF (317K)
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