Shinku
Online ISSN : 1880-9413
Print ISSN : 0559-8516
ISSN-L : 0559-8516
Search
Advanced search
OR
Browse
Search
Volume 13, Issue 10
Displaying 1-3 of 3 articles from this issue
Show all abstracts
    • |<
    • <
    • 1
    • >
    • >|
  • Superinsulation
    Juichi ISHII
    1970 Volume 13 Issue 10 Pages 318-326
    Published: October 20, 1970
    Released on J-STAGE: January 28, 2010
    DOIhttps://doi.org/10.3131/jvsj.13.318
    JOURNAL FREE ACCESS
    Download PDF (1358K)
  • New Method of Rapid Measuren ent of Very Small Surface Area of Solids
    Kuniaki WATANABE, Toshiro YAMASHINA
    1970 Volume 13 Issue 10 Pages 327-332
    Published: October 20, 1970
    Released on J-STAGE: September 29, 2009
    DOIhttps://doi.org/10.3131/jvsj.13.327
    JOURNAL FREE ACCESS
    Show abstractHide abstract
    The new device for rapid and precise measurement of small surface area (10100cm2) of solids by using the xenon adsorption has been constructed. The aparatus includes a system capable of obtaining pressure 10-9 torr by a sputter ion pump and two pressure measuring portions being denominated as “adsorption cell” (250 cc) and “reference cell” (160 cc), respectively. After the sample being outgassed and cooled to the liquid nitrogen temperature, xenon gas is admitted into the adsorption cell from the reference cell in which xenon gas has been stored 25×10-2 cc STP. The amount of adsorbed gas can be estimated from the change in pressure of each portion. Thus it usually takes only half an hour to obtain a BET plot with four or five points, and the reproducibilily in the determination of the surface areas has been found to be better than 2%. The several examples show by the present method have been demonstrated on glass and quartz surfaces. These results a good agreement with those by other workers.
    View full abstract
    Download PDF (853K)
  • Memory Effect of a Sputter Ion Pump
    Kaoru ASAO, Yutaka TUZI
    1970 Volume 13 Issue 10 Pages 333-336
    Published: October 20, 1970
    Released on J-STAGE: September 29, 2009
    DOIhttps://doi.org/10.3131/jvsj.13.333
    JOURNAL FREE ACCESS
    Show abstractHide abstract
    The memory effect of a sputter ion pump was observed by the mass spectrometric analysis of gases in the vacuum spparatus evacuating with the sputter ion pump and the Hickman pump in parallel. When sample gas, helium or neon, is introduced into the apparatus, concentration of impurity gases in the apparatus changes according to the working condition of the pumping system. If the apparatus is evacuated with the Hickman pump only, the impurity concentration is usually low, while the concentration increases with the working of the sputter Ion pump. This phenomena show the memory effect of the sputter ion pump. The results also show that the main impurity gases in the present case are hydrogen, carbon monoxide and neon depending on the short-period histry of the sputter ion pump, and that deuterium absorbed by the pump about one year ago appears as HD.
    View full abstract
    Download PDF (441K)
    • |<
    • <
    • 1
    • >
    • >|
feedback
 Top