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Volume 17, Issue 12
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Tokishige KINOSHITA1974 Volume 17 Issue 12 Pages 423-437
Published: December 20, 1974
Released on J-STAGE: September 04, 2009
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Satoru TODOROKI, Yoshiharu ONUMA1974 Volume 17 Issue 12 Pages 438-444
Published: December 20, 1974
Released on J-STAGE: September 04, 2009
JOURNAL FREE ACCESSThe Hall coefficient and thermoelectric power of p-type polycrystalline SnTe thin films for hole densities between 3× 1019 cm-3 and 5 × 1021 cm-3 which are evaporated on glass substrate are measured. The dependence of thermoelectric power on hole density shows a maximum at hole density between 3 × 1020 cm-3 and 5 × 1020 cm-3 and the ratio of high to low temperature Hall coefficient shows a maximum in the vicinity of temperature of 450 °K. These anomalous behaviors are interpreted in terms of second valence band. The separation energy of two valence bands as 0.297 eV is derived from temperature dependence of Hall coefficient, considering the ratio of actual carrier density to Hall density (P = 1/e · RH).View full abstractDownload PDF (935K)
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