Unaxially oriented films of poly (tetramethylene succinate) [PTMS] were prepared by drawing at room temperature [r. t.]. The films were deformed by tensile extension at r. t., held under a fixed-strain condition at r. t. or at 107°C, and then strain-released at r. t. These processes were examined by the stress-strain [S-S] measurement and the
in situ time-resolved wide-angle X-ray diffraction [WAXD] using an Imaging Plate system. The range of strain (ε) utilized in this study was 0_??_ε<25%.
In the range of ε where the α_??_β crystalline phase transition takes place, the slope of the S-S curve for each of the extension and strain-releasing processes was smaller than those before and after this range of ε. In the holding processes at a fixed strain (ε=22_??_23%), any significant difference in WAXD pattern was not recognized between the holding at r. t. and that at 107°C, though the crystalline reflections became sharp and the stress relaxation was fairly promoted at the higher temperature. In the strain-releasing process at r. t. after holding at 107°C, however, the range of ε for the α_??_β transition was shifted to the higher strain side. It was concluded that “stress”, not strain, should be a major factor for inducing the transition, and the “critical stress” at r. t. was estimated at about 100MPa.
As a mechanical model for the uniaxially oriented PTMS film, the Series-Parallel model with two kinds of amorphous components was found to be adequate for tensile extension at r. t.: One amorphous component is connected in series to the crystalline component, and the other is connected in parallel to the composite of crystalline and amorphous components which are in series. It is considered that the
series component has a long relaxation time, but that the
parallel one has a shorter relaxation time and can be readily relaxed even at r. t.
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